Multi-vernier time-to-digital converter implemented in a field-programmable gate array

The method of time-to-digital conversion is described which is based on the N-times multiplied vernier technique and statistical evaluation of measurement results. The test results of an integrated converter created on a single field-programmable gate array (FPGA) device manufactured by Quick Logic are also presented. The measuring range was 6 ns with 205 ps resolution. In this method quick starting and highly stabilized vernier oscillators are not required. So an exact match between the physical structure of the converter and the topology of the programmable device is not required and time delays resulting from different signal paths can be discarded. (technical design note)