Published January 2007 | Version v1
Journal article

Near-field reflection backscattering apertureless optical microscopy: Application to spectroscopy experiments on opaque samples, comparison between lock-in and digital photon counting detection techniques

  • 1. Institut Charles Delaunay, CNRS FRE 2848, Laboratoire de Nanotechnologie et d'Instrumentation Optique, Universite de technologie de Troyes, 12 rue Marie Curie, BP 2060, 10010 Troyes cedex (France)

Description

An apertureless scanning near-field optical microscope (ASNOM) in reflection backscattering configuration is designed to conduct spectroscopic experiments on opaque samples constituted of latex beads. The ASNOM proposed takes advantage of the depth-discrimination properties of confocal microscopes to efficiently extract the near-field optical signal. Given their importance in a spectroscopic experiment, we systematically compare the lock-in and synchronous photon counting detection methods. Some results of Rayleigh's scattering in the near field of the test samples are used to illustrate the possibilities of this technique for reflection backscattering spectroscopy

Additional details

Identifiers

DOI
10.1016/j.ultramic.2006.04.009;
PII
S0304-3991(06)00078-7;

Publishing Information

Journal Title
Ultramicroscopy (Amsterdam)
Journal Volume
107
Journal Issue
1
Journal Page Range
p. 16-24
ISSN
0304-3991
CODEN
ULTRD6

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.