Published January 2007
| Version v1
Journal article
Near-field reflection backscattering apertureless optical microscopy: Application to spectroscopy experiments on opaque samples, comparison between lock-in and digital photon counting detection techniques
Creators
- 1. Institut Charles Delaunay, CNRS FRE 2848, Laboratoire de Nanotechnologie et d'Instrumentation Optique, Universite de technologie de Troyes, 12 rue Marie Curie, BP 2060, 10010 Troyes cedex (France)
Description
An apertureless scanning near-field optical microscope (ASNOM) in reflection backscattering configuration is designed to conduct spectroscopic experiments on opaque samples constituted of latex beads. The ASNOM proposed takes advantage of the depth-discrimination properties of confocal microscopes to efficiently extract the near-field optical signal. Given their importance in a spectroscopic experiment, we systematically compare the lock-in and synchronous photon counting detection methods. Some results of Rayleigh's scattering in the near field of the test samples are used to illustrate the possibilities of this technique for reflection backscattering spectroscopy
Additional details
Identifiers
- DOI
- 10.1016/j.ultramic.2006.04.009;
- PII
- S0304-3991(06)00078-7;
Publishing Information
- Journal Title
- Ultramicroscopy (Amsterdam)
- Journal Volume
- 107
- Journal Issue
- 1
- Journal Page Range
- p. 16-24
- ISSN
- 0304-3991
- CODEN
- ULTRD6
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38023028
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- BACKSCATTERING; CONFIGURATION; DEPTH; DETECTION; FLUORESCENCE SPECTROSCOPY; LATEX; OPTICAL MICROSCOPES; OPTICAL MICROSCOPY; PHOTONS; RAYLEIGH SCATTERING; REFLECTION; SIGNALS
- Descriptors DEC
- BOSONS; COHERENT SCATTERING; DIMENSIONS; ELASTOMERS; ELEMENTARY PARTICLES; EMISSION SPECTROSCOPY; MASSLESS PARTICLES; MICROSCOPES; MICROSCOPY; ORGANIC COMPOUNDS; ORGANIC POLYMERS; POLYMERS; RUBBERS; SCATTERING; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.