Published November 2009 | Version v1
Journal article Metadata-only

Effect of Temperature on Structural and Magnetic Properties of Laser Ablated Iron Oxide Deposited on Si(100)

Creators

  • 1. Centre for Solid State Physics, University of Punjab, Lahore-54590 (Pakistan)
  • 2. School of Science and Engineering, Lahore University of Management Sciences (LUMS), Opposite Sector U, D.H.A. Lahore 54972 (Pakistan)
  • 3. Department of Physics, KAIST, 373–1 Guseong-dong, Yuseong-gu, Daejeon, 305–701 (Korea, Republic of)

Description

We fabricate Fe3O4 thin films on Si(100) substrates at different temperatures using pulsed laser deposition, and study the effect of annealing and deposition temperature on the structural and magnetic properties of Fe3O4 thin films. Subsequently, the films are characterized by x-ray diffraction (XRD), scanning electron microscopy (SEM) and vibrating sample magnetometery (VSM). The XRD results of these films confirm the presence of the Fe3O4 phase and show room-temperature ferromagnetism, as observed with VSM. We demonstrate the optimized deposition and annealing conditions for an enhanced magnetization of 854 emu/cm3 that is very high when compared to the bulk sample. (condensed matter: electronic structure, electrical, magnetic, and optical properties)

Availability note (English)

Available from http://dx.doi.org/10.1088/0256-307X/26/11/117504

Additional details

Identifiers

DOI
10.1088/0256-307X/26/11/117504;

Publishing Information

Journal Title
Chinese Physics Letters
Journal Volume
26
Journal Issue
11
Journal Page Range
[4 p.]
ISSN
0256-307X
CODEN
CPLEEU

INIS

Country of Publication
China
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44123224
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
ANNEALING; COMPARATIVE EVALUATIONS; CRYSTAL STRUCTURE; ENERGY BEAM DEPOSITION; FERROMAGNETISM; IRON OXIDES; LASER RADIATION; MAGNETIC PROPERTIES; MAGNETIZATION; PULSED IRRADIATION; SCANNING ELECTRON MICROSCOPY; SILICON; SUBSTRATES; TEMPERATURE RANGE 0273-0400 K; THIN FILMS; VIBRATING SAMPLE MAGNETOMETERS; X-RAY DIFFRACTION
Descriptors DEC
CHALCOGENIDES; COHERENT SCATTERING; DEPOSITION; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; ELEMENTS; EVALUATION; FILMS; HEAT TREATMENTS; IRON COMPOUNDS; IRRADIATION; MAGNETISM; MAGNETOMETERS; MEASURING INSTRUMENTS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; RADIATIONS; SCATTERING; SEMIMETALS; SURFACE COATING; TEMPERATURE RANGE; TRANSITION ELEMENT COMPOUNDS