Published January 1, 2011
| Version v1
Journal article
Design of a scanning polarimetric scatterometer for rough surface scattering measurements
Creators
- 1. Centro de Ciencias Aplicadas y Desarrollo Tecnologico, Universidad Nacional Autonoma de Mexico, Mexico, D.F. 04510 (Mexico)
Description
This paper presents the mechanical design of a goniometric scatterometer to be used to measure the light scattered in rough surfaces. Advances in the instrumentation of a polarization measurement system are also presented. It has been found that the linear part of the retardance vs. voltage curves for a liquid crystal retarder corresponds to retardance between λ and λ/2 and that this range of retardance leads to variations in the frequency components of the time-varying detected signal for sinusoidal voltage. Preliminary results for a Stokes polarimeter are presented.
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/274/1/012135Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 274
- Journal Issue
- 1
- Journal Page Range
- [7 p.]
- ISSN
- 1742-6596
Conference
- Title
- 17. annual Ibero-American conference on optics (RIAO); 10. Latin American meeting on optics, lasers and applications (OPTILAS)
- Dates
- 20-24 Sep 2010
- Place
- Lima (Peru)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43047169
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- LIQUID CRYSTALS; POLARIMETERS; POLARIZATION; SCATTERING; SURFACES; VISIBLE RADIATION
- Descriptors DEC
- CRYSTALS; ELECTROMAGNETIC RADIATION; FLUIDS; LIQUIDS; RADIATIONS