Published January 1, 2011 | Version v1
Journal article

Design of a scanning polarimetric scatterometer for rough surface scattering measurements

  • 1. Centro de Ciencias Aplicadas y Desarrollo Tecnologico, Universidad Nacional Autonoma de Mexico, Mexico, D.F. 04510 (Mexico)

Description

This paper presents the mechanical design of a goniometric scatterometer to be used to measure the light scattered in rough surfaces. Advances in the instrumentation of a polarization measurement system are also presented. It has been found that the linear part of the retardance vs. voltage curves for a liquid crystal retarder corresponds to retardance between λ and λ/2 and that this range of retardance leads to variations in the frequency components of the time-varying detected signal for sinusoidal voltage. Preliminary results for a Stokes polarimeter are presented.

Availability note (English)

Available from http://dx.doi.org/10.1088/1742-6596/274/1/012135

Additional details

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
274
Journal Issue
1
Journal Page Range
[7 p.]
ISSN
1742-6596

Conference

Title
17. annual Ibero-American conference on optics (RIAO); 10. Latin American meeting on optics, lasers and applications (OPTILAS)
Dates
20-24 Sep 2010
Place
Lima (Peru)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43047169
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
LIQUID CRYSTALS; POLARIMETERS; POLARIZATION; SCATTERING; SURFACES; VISIBLE RADIATION
Descriptors DEC
CRYSTALS; ELECTROMAGNETIC RADIATION; FLUIDS; LIQUIDS; RADIATIONS