Published April 2018 | Version v1
Journal article

Influence of the substrate temperature on the microstructure and electron-induced secondary electron emission properties of MgO/Au composite film

  • 1. Key Laboratory for Physical Electronics and Devices of the Ministry of Education, Xi'an Jiaotong University, No.28, Xianning West Road, Xi'an 710049 (China)

Description

Highlights: • MgO/Au film was prepared by magnetron sputtering of individual Mg and Au targets. • A higher substrate temperature (Ts) is conducive to the growth of MgO grains. • The surface roughness firstly rises and then decreases with Ts increasing. • The increase of Ts greatly enhances the SEE coefficient of the composite film. - Abstract: The influence of the substrate temperature (Ts) on the microstructure and electron-induced secondary electron emission (SEE) properties of MgO/Au composite film prepared by reactive magnetron sputtering was investigated in order to improve the SEE performance of this composite film. During the deposition of MgO/Au film, a relatively high Ts is conducive to the growth of MgO grains and causes the formation of some large aggregated gold particles on which MgO grains cover in the composite film. In terms of the SEE properties of MgO/Au film, the increase of Ts brings about a significant improvement of SEE coefficient (δ), while it also leads to a slightly accelerated SEE degradation under the continuous electron bombardment due to a faster surface charging. The MgO/Au film prepared at Ts of 773 K has a δ value of 4.9 at a primary electron energy of 200 eV and the maximum δ value of 11.5.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.materresbull.2018.01.002

Additional details

Identifiers

DOI
10.1016/j.materresbull.2018.01.002;
PII
S0025540817319761;

Publishing Information

Journal Title
Materials Research Bulletin
Journal Volume
100
Journal Page Range
p. 308-312
ISSN
0025-5408
CODEN
MRBUAC

Optional Information

Copyright
Copyright (c) 2017 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.