Published March 31, 2010 | Version v1
Journal article

Growth process observation of homoepitaxial ZnO thin films using optical emission spectra during pulsed laser deposition

  • 1. Department of Physics and Electronics, Graduate School of Engineering, Osaka Prefecture University, 1-1 Gakuen-cho, Naka-ku, Sakai, Osaka 599-8531 (Japan)

Description

Homoepitaxial ZnO thin films were prepared on the Zn-polar or O-polar ZnO substrates by pulsed laser deposition method. Optical emission spectroscopy of the plume was carried out to estimate O/Zn flux ratio under the various deposition conditions such as oxygen pressure, laser fluence, and the distance between target and substrate. It is revealed that the O/Zn flux ratio could be controlled by laser fluence, oxygen pressure, and target-substrate distance. Zn-rich O/Zn flux promotes pit formation and O-rich flux yields the three-dimensional growth. The difference of the growth process on Zn-polar or O-polar substrates is also discussed.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2009.09.184

Additional details

Identifiers

DOI
10.1016/j.tsf.2009.09.184;
PII
S0040-6090(09)01782-9;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
518
Journal Issue
11
Journal Page Range
p. 2971-2974
ISSN
0040-6090
CODEN
THSFAP

Conference

Title
6. international symposium on transparent oxide thin films for electronics and optics
Acronym
TOEO-6
Dates
15-17 Apr 2009
Place
Tokyo (Japan)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
42054777
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
EMISSION SPECTRA; EMISSION SPECTROSCOPY; ENERGY BEAM DEPOSITION; EPITAXY; LASER RADIATION; PULSED IRRADIATION; THIN FILMS; ZINC OXIDES
Descriptors DEC
CHALCOGENIDES; CRYSTAL GROWTH METHODS; DEPOSITION; ELECTROMAGNETIC RADIATION; FILMS; IRRADIATION; OXIDES; OXYGEN COMPOUNDS; RADIATIONS; SPECTRA; SPECTROSCOPY; SURFACE COATING; ZINC COMPOUNDS

Optional Information

Copyright
Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.