Published March 31, 2010
| Version v1
Journal article
Growth process observation of homoepitaxial ZnO thin films using optical emission spectra during pulsed laser deposition
Creators
- 1. Department of Physics and Electronics, Graduate School of Engineering, Osaka Prefecture University, 1-1 Gakuen-cho, Naka-ku, Sakai, Osaka 599-8531 (Japan)
Description
Homoepitaxial ZnO thin films were prepared on the Zn-polar or O-polar ZnO substrates by pulsed laser deposition method. Optical emission spectroscopy of the plume was carried out to estimate O/Zn flux ratio under the various deposition conditions such as oxygen pressure, laser fluence, and the distance between target and substrate. It is revealed that the O/Zn flux ratio could be controlled by laser fluence, oxygen pressure, and target-substrate distance. Zn-rich O/Zn flux promotes pit formation and O-rich flux yields the three-dimensional growth. The difference of the growth process on Zn-polar or O-polar substrates is also discussed.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2009.09.184Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2009.09.184;
- PII
- S0040-6090(09)01782-9;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 518
- Journal Issue
- 11
- Journal Page Range
- p. 2971-2974
- ISSN
- 0040-6090
- CODEN
- THSFAP
Conference
- Title
- 6. international symposium on transparent oxide thin films for electronics and optics
- Acronym
- TOEO-6
- Dates
- 15-17 Apr 2009
- Place
- Tokyo (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42054777
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- EMISSION SPECTRA; EMISSION SPECTROSCOPY; ENERGY BEAM DEPOSITION; EPITAXY; LASER RADIATION; PULSED IRRADIATION; THIN FILMS; ZINC OXIDES
- Descriptors DEC
- CHALCOGENIDES; CRYSTAL GROWTH METHODS; DEPOSITION; ELECTROMAGNETIC RADIATION; FILMS; IRRADIATION; OXIDES; OXYGEN COMPOUNDS; RADIATIONS; SPECTRA; SPECTROSCOPY; SURFACE COATING; ZINC COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.