Published January 2007 | Version v1
Journal article

The UW-PTMS

  • 1. University of Washington, Physics Department (United States)

Description

University of Washington Penning Trap Mass Spectrometer (UW-PTMS) is now producing measurements with uncertainties approaching 10 parts per trillion (ppt). We have recently published (Van Dyck, Jr. et al., Int J Mass Spectrom 251:231-242, 2006) detailed analysis of several systematic shifts which can be important at this level of accuracy. Experimental studies of these effects in our older PTMS, combined with preliminary analysis of 2H data, and re-analysis of the previously reported 4He (Van Dyck, Jr. et al., Phys Rev Lett 92:220802/1, 2004) and 16O (Van Dyck, Jr. et al., Hyperfine Interact 132:163-175, 2001) data, gives more accurate atomic mass values for 16O, 4He, and 2H. Currently we are taking data for a new measurement of the 3He atomic mass, and working on some improvements to the PTMS, including a new amplifier system for phase-sensitive detection of the ion's axial motion, and a new computer-controlled ultra-stable voltage source for the Penning trap's ring electrode, used to adjust the ion's axial frequency. These new systems will allow us to simultaneously manipulate individual ions in two nearby Penning traps, and some sources of noise will be the same for both traps. We plan to investigate several techniques which should reduce measurement time and improve accuracy by working with the two ions simultaneously.

Additional details

Identifiers

Publishing Information

Journal Title
Hyperfine Interactions
Journal Volume
174
Journal Issue
1-3
Journal Page Range
p. 47-53
ISSN
0304-3843
CODEN
HYINDN

Conference

Title
4. international conference on trapped charged particles and fundamental physics
Acronym
TCP 2006
Dates
3-8 Sep 2006
Place
Parksville (Canada)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43029698
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ACCURACY; AMPLIFIERS; DETECTION; DEUTERIUM; ELECTRIC POTENTIAL; ELECTRODES; HELIUM 3; HELIUM 4; IONS; MASS; MASS SPECTROMETERS; NOISE; OXYGEN 16; TRAPS
Descriptors DEC
CHARGED PARTICLES; ELECTRONIC EQUIPMENT; EQUIPMENT; EVEN-EVEN NUCLEI; EVEN-ODD NUCLEI; HELIUM ISOTOPES; HYDROGEN ISOTOPES; ISOTOPES; LIGHT NUCLEI; MEASURING INSTRUMENTS; NUCLEI; ODD-ODD NUCLEI; OXYGEN ISOTOPES; SPECTROMETERS; STABLE ISOTOPES

Optional Information

Copyright
Copyright (c) 2007 Springer Science+Business Media B.V.