Published 1996
| Version v1
Book
Electroluminescence yield for λ > 165 nm in neon-xenon mixtures: Experimental results
- 1. Univ. of Coimbra (Portugal)
- 2. Rikkyo Univ., Tokyo (Japan)
Description
The electroluminescence yield for λ > 165 am in different neon-xenon mixtures is studied as a function of the reduced electric field. These studies were performed using a uniform-field gas proportional scintillation counter. The experimental values obtained for the scintillation and ionization thresholds decrease from approximately 1 and 6 Vcm-1 torr-1 for 100% xenon, to about 0.5 and 3.8 Vcm-1 torr-1 for 20% xenon, to 0.4 and 2.8 Vcm-1 torr-1 for 10% xenon and to 0.3 and 2.2 Vcm-1 torr-1 for 5% xenon. Detector energy resolutions for the Al K line (1.5 keV) are 15% for 20% xenon, 19% for 10% xenon and 22% for 5% xenon
Additional details
Publishing Information
- Publisher
- IEEE Service Center.
- Imprint Place
- Piscataway, NJ (United States)
- Imprint Title
- 1996 IEEE nuclear science symposium - conference record. Volumes 1, 2 and 3
- Imprint Pagination
- 2138 p.
- Journal Page Range
- p. 77-79.
Conference
- Title
- Institute of Electrical and Electronic Engineers (IEEE) nuclear science symposium and medical imaging conference.
- Dates
- 2-9 Nov 1996.
- Place
- Anaheim, CA (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 28068944
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ELECTROLUMINESCENCE; GAS SCINTILLATION DETECTORS; MIXTURES; NEON; X-RAY DETECTION; XENON
- Descriptors DEC
- DETECTION; DISPERSIONS; ELEMENTS; EMISSION; LUMINESCENCE; MEASURING INSTRUMENTS; NONMETALS; PHOTON EMISSION; RADIATION DETECTION; RADIATION DETECTORS; RARE GASES; SCINTILLATION COUNTERS
Optional Information
- Secondary number(s)
- CONF-961123--.