Published 1996 | Version v1
Book

Electroluminescence yield for λ > 165 nm in neon-xenon mixtures: Experimental results

  • 1. Univ. of Coimbra (Portugal)
  • 2. Rikkyo Univ., Tokyo (Japan)

Description

The electroluminescence yield for λ > 165 am in different neon-xenon mixtures is studied as a function of the reduced electric field. These studies were performed using a uniform-field gas proportional scintillation counter. The experimental values obtained for the scintillation and ionization thresholds decrease from approximately 1 and 6 Vcm-1 torr-1 for 100% xenon, to about 0.5 and 3.8 Vcm-1 torr-1 for 20% xenon, to 0.4 and 2.8 Vcm-1 torr-1 for 10% xenon and to 0.3 and 2.2 Vcm-1 torr-1 for 5% xenon. Detector energy resolutions for the Al K line (1.5 keV) are 15% for 20% xenon, 19% for 10% xenon and 22% for 5% xenon

Additional details

Publishing Information

Publisher
IEEE Service Center.
Imprint Place
Piscataway, NJ (United States)
Imprint Title
1996 IEEE nuclear science symposium - conference record. Volumes 1, 2 and 3
Imprint Pagination
2138 p.
Journal Page Range
p. 77-79.

Conference

Title
Institute of Electrical and Electronic Engineers (IEEE) nuclear science symposium and medical imaging conference.
Dates
2-9 Nov 1996.
Place
Anaheim, CA (United States).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
28068944
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ELECTROLUMINESCENCE; GAS SCINTILLATION DETECTORS; MIXTURES; NEON; X-RAY DETECTION; XENON
Descriptors DEC
DETECTION; DISPERSIONS; ELEMENTS; EMISSION; LUMINESCENCE; MEASURING INSTRUMENTS; NONMETALS; PHOTON EMISSION; RADIATION DETECTION; RADIATION DETECTORS; RARE GASES; SCINTILLATION COUNTERS

Optional Information

Secondary number(s)
CONF-961123--.