A thermographic data augmentation and signal separation method for defect detection
- 1. Institute of Process Equipment and Control Engineering, Zhejiang University of Technology, Hangzhou (China)
- 2. Department of Chemical Engineering, National Tsing Hua University, Hsinchu, Taiwan (China)
Description
Non-destructive testing is a popular technique for defect assessment of composite materials, where machine learning models become more important in its data analysis. Nevertheless, deep learning, which has achieved state-of-the-art results in many tasks, has received less attention in this field. Herein, a generative independent component (IC) thermography method is proposed. In detail, a generative adversarial network is implemented for image augmentation, which generates fake thermal images that mimic the patterns of real measurements. In doing this, the sample size is enlarged and the defect information contained in the images is enriched. Then, both the real and fake thermal images are decomposed by IC analysis, which separates the defect signals represented by non-Gaussian sources and the non-uniform backgrounds caused by uneven heating. Consequently, the defect detection results are improved. The performance of the proposed method on a polymer composite specimen demonstrates its effectiveness. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1361-6501/abc63fAdditional details
Identifiers
Publishing Information
- Journal Title
- Measurement Science and Technology
- Journal Volume
- 32
- Journal Issue
- 4
- Journal Page Range
- [10 p.]
- ISSN
- 0957-0233
- CODEN
- MSTCEP
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 53045995
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- CHARGES; COMPOSITE MATERIALS; DATA ANALYSIS; DEFECTS; DETECTION; HEATING; IMAGES; MACHINE LEARNING; NONDESTRUCTIVE TESTING; PERFORMANCE; POLYMERS; SIGNALS; THERMOGRAPHY
- Descriptors DEC
- ALGORITHMS; ARTIFICIAL INTELLIGENCE; DATA PROCESSING; LEARNING; MATERIALS; MATERIALS TESTING; MATHEMATICAL LOGIC; MEASURING METHODS; PROCESSING; TESTING