Published 1982 | Version v1
Miscellaneous Metadata-only

Precision in Auger analysis

Creators

  • 1. National Research Council of Canada, Ottawa, Ontario

Description

no abstract available

Part of:
Proceedings

Additional details

Publishing Information

ISBN
0-920622-10-0
Imprint Title
Proceedings
Imprint Pagination
77 p.
Journal Page Range
p. 52-53.
Report number
INIS-mf--9645

Conference

Title
Microscopical Society of Canada 9. annual meeting.
Dates
11-13 Jun 1982.
Place
Edmonton, Alberta (Canada).

INIS

Country of Publication
Canada
Country of Input or Organization
Canada
INIS RN
16027568
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference, No Abstract
Descriptors DEI
ACCURACY; AUGER ELECTRON SPECTROSCOPY; INTERFACES; ION BEAMS; QUANTITATIVE CHEMICAL ANALYSIS; SPUTTERING; THIN FILMS
Descriptors DEC
BEAMS; CHEMICAL ANALYSIS; ELECTRON SPECTROSCOPY; FILMS; SPECTROSCOPY

Optional Information

Notes
Summary.