Published March 1994 | Version v1
Report

Surface enhanced Raman scattering as an in-reactor monitor of phenomena of interest to the Nuclear Power Industry

Creators

  • 1. Univ. of California, Berkeley, CA (United States)

Description

Surface enhanced Raman spectroscopy (SERS) is proposed as a technique for monitoring in situ the passive films and corrosion products that form on the surfaces of alloys of interest in nuclear power plants. The technique is a highly sensitive procedure for detecting even very small quantities of species present on surfaces, in particular the surface of metallic alloys. The data could, for example, identify the constituents in passive films that are less than a monolayer in average thickness. Processes such as 60Co pick-up could be monitored in real time. In fact, if it is known that incorporation of 60Co occurs when a particular oxide film forms on the surface of the alloy, then measurement of the SER spectra could indicate when such films are beginning to form and thereby provide an early indication that conditions inside the reactor are now suitable for 60Co pick-up in the passive films

Additional details

Publishing Information

Imprint Title
Proceedings: On-line monitoring of corrosion an water chemistry for the electric power utility industry: An EPRI workshop held during the 12th International Corrosion Congress
Imprint Pagination
329 p.
Journal Page Range
p. 22.1-22.4.
Report number
EPRI-TR--103742

Conference

Title
12. international corrosion congress.
Dates
19-24 Sep 1993.
Place
Houston, TX (United States).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
26033773
Subject category
S21: SPECIFIC NUCLEAR REACTORS AND ASSOCIATED PLANTS; S21: SPECIFIC NUCLEAR REACTORS AND ASSOCIATED PLANTS;
Resource subtype / Literary indicator
Conference, Non-conventional Literature
Descriptors DEI
DEPOSITS; ON-LINE MEASUREMENT SYSTEMS; RAMAN SPECTROSCOPY; REACTORS; SURFACE CONTAMINATION
Descriptors DEC
CONTAMINATION; LASER SPECTROSCOPY; ON-LINE SYSTEMS; SPECTROSCOPY

Optional Information

Secondary number(s)
CONF-9309150--Pt.1.