Published June 2008 | Version v1
Journal article

Performance modeling in critical engineering systems using RAM analysis

  • 1. Department of Mechanical Engineering, National Institute of Technology, Hamirpur-177005, Himachal Pradesh (India)

Description

Reliability, availability and maintainability (RAM) analysis of system is helpful in carrying out design modifications, if any, required to achieve minimum failures or to increase mean time between failures (MTBF) and thus to plan maintainability requirements, optimize reliability and maximize equipment availability. To this effect, the paper presents the application of RAM analysis in a process industry. Markovian approach is used to model the system behavior. For carrying out analysis, transition diagrams for various subsystems are drawn and differential equations associated with them are formulated. After obtaining the steady state solution the corresponding values of reliability and maintainability are estimated at different mission times. The computed results are presented to plant personnel for their active consideration. The results proved helpful to them for analyzing the system behavior and thereby to improve the system performance considerably by adopting and practicing suitable maintenance policies/strategies

Availability note (English)

Available from http://dx.doi.org/10.1016/j.ress.2007.03.039

Additional details

Identifiers

DOI
10.1016/j.ress.2007.03.039;
PII
S0951-8320(07)00131-7;

Publishing Information

Journal Title
Reliability Engineering and System Safety
Journal Volume
93
Journal Issue
6
Journal Page Range
p. 913-919
ISSN
0951-8320
CODEN
RESSEP

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
39065529
Subject category
S42: ENGINEERING;
Descriptors DEI
AVAILABILITY; DESIGN; DIAGRAMS; DIFFERENTIAL EQUATIONS; ENGINEERING; EQUIPMENT; FAILURES; INDUSTRY; MAINTENANCE; MARKOV PROCESS; MATHEMATICAL SOLUTIONS; MODIFICATIONS; PERFORMANCE; RELIABILITY; SIMULATION; STEADY-STATE CONDITIONS
Descriptors DEC
EQUATIONS; INFORMATION; STOCHASTIC PROCESSES

Optional Information

Copyright
Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.