Published November 1, 2008
| Version v1
Journal article
Projection of speckle patterns for 3D sensing
- 1. Departamento de Optica, Universitat de Valencia, c/Dr. Moliner 50, 46100 Burjassot (Spain)
- 2. School of Engineering, Bar-Ilan University, Ramat-Gan 52900 (Israel)
- 3. Department of Mathematics, Bar-Ilan University, Ramat-Gan 52900 (Israel)
Description
In this communication we present the use of projected speckle patterns coming from a phase random mask for sensing depths and thicknesses. The sensing is based on the change of the speckle pattern with propagation and the lack of correlation between speckle patterns recorded at different depths or lateral locations. The principle is used for mapping thickness of transparent media, for depth ranging and for 3D mapping of diffuse objects.
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/139/1/012026Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 139
- Journal Issue
- 1
- Journal Page Range
- [6 p.]
- ISSN
- 1742-6596
Conference
- Title
- 7. international workshop on information optics
- Acronym
- WIO-08
- Dates
- 1-5 Jun 2008
- Place
- Annecy (France)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41050544
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CORRELATIONS; DEPTH; IMAGE PROCESSING; MAPPING; OPTICS; RANDOMNESS; THICKNESS
- Descriptors DEC
- DIMENSIONS; PROCESSING