Published December 15, 2004 | Version v1
Journal article

The role of ab initio electronic structure calculations in studies of the strength of materials

Description

In this paper we give an account of applications of quantum-mechanical (first-principles) electronic structure calculations to the problem of theoretical tensile strength in metals and intermetallics. First, we review previous as well as ongoing research on this subject. We then describe briefly the electronic structure calculational methods and simulation of the tensile test. This approach is then illustrated by calculations of theoretical tensile strength in iron and in the intermetallic compound Ni3Al. The anisotropy of calculated tensile strength is explained in terms of higher-symmetry structures encountered along the deformation paths studied. The table summarizing values of theoretical tensile strengths calculated up to now is presented and the role of ab initio electronic structure calculations in contemporary studies of the strength of material is discussed

Additional details

Identifiers

DOI
10.1016/j.msea.2003.10.376;
PII
S0921509304006975;

Publishing Information

Journal Title
Materials Science and Engineering. A, Structural Materials: Properties, Microstructure and Processing
Journal Volume
387-389
Journal Issue
2-3
Journal Page Range
p. 148-157
ISSN
0921-5093
CODEN
MSAPE3

Conference

Title
13. international conference on the strength of materials
Dates
25-30 Aug 2003
Place
Budapest (Hungary)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38055535
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ANISOTROPY; DEFORMATION; ELASTICITY; ELECTRONIC STRUCTURE; INTERMETALLIC COMPOUNDS; IRON; MAGNETISM; NONLINEAR PROBLEMS; QUANTUM MECHANICS; SIMULATION; SYMMETRY; TENSILE PROPERTIES
Descriptors DEC
ALLOYS; ELEMENTS; MECHANICAL PROPERTIES; MECHANICS; METALS; TRANSITION ELEMENTS

Optional Information

Copyright
Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.