Void coefficient measuring device
Description
The device of the present invention measures the void coefficient of a hydrogen-containing fluid easily at a high accuracy by utilizing fast neutrons. Namely, a fast neutron source is disposed at the outer side of a pipeline in which the hydrogen-containing fluid flows. A neutron detector having the circumference being surrounded by neutron moderators is disposed to a position opposite to the source. Neutron shielding materials are disposed at the circumference of the pipeline. Then, only fast neutrons passing the hydrogen-containing fluid in the pipeline among fast neutrons emitted from the neutron source are formed into thermal neutrons by the neutron moderators and detected efficiently. The amount of the detected neutrons depends on the void coefficient in the fluid in the pipeline. Accordingly, the void coefficient in the hydrogen-containing fluid can be measured. The device of the present invention can measure the void coefficient efficiently by using the radiation source at an intensity not undergoing legal regulation. (I.S.)
Availability note (English)
Available from JAPIO. Also available from EPO.Additional details
Publishing Information
- Imprint Pagination
- 6 p.
- IPC:
- Int. Cl. G01N23/09; G01N23/12; G01T1/167; G01T3/00; G21C17/02.
- IPC
- Int. Cl. G01N23/09; G01N23/12; G01T1/167; G01T3/00; G21C17/02.
- Patent number
- JP patent document 9-304304/A/
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 29025672
- Subject category
- S07: ISOTOPES AND RADIATION SOURCES;
- Resource subtype / Literary indicator
- Non-conventional Literature
- Descriptors DEI
- BUBBLES; FAST NEUTRONS; FLUIDS; HYDROGEN; MEASURING METHODS; NEUTRON DETECTORS; NEUTRON SOURCES; THERMAL NEUTRONS; VOID COEFFICIENT; VOIDS
- Descriptors DEC
- BARYONS; ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; HADRONS; MEASURING INSTRUMENTS; NEUTRONS; NONMETALS; NUCLEONS; PARTICLE SOURCES; RADIATION DETECTORS; RADIATION SOURCES; REACTIVITY COEFFICIENTS
Optional Information
- Secondary number(s)
- JP patent application 8-148104.