X-ray structure of Cs-doped polyacetylene
- 1. Laboratory for Research on the Structure of Matter, University of Pennsylvania, Philadelphia, Pennsylvania 19104 (USA)
- 2. Groupe de Dynamique des Phases Condensees, Universite des Sciences et Techniques du Languedoc, 34060 Montpellier CEDEX, (France)
Description
The x-ray powder profile of heavily doped [(CH)Csy]x is analyzed on the basis of three dimensionally ordered intercalate channels. Fifteen peaks representing 27 unique reflections are well described (positions and intensities) by a tetragonal pseudocell with bar a=bar b=9.093 A, bar c=7.950 A containing 24 (CH) and 4 Cs units (y=0.167). The Cs and (CH) sublattices are actually incommensurate along bar c, with 6.46 undistorted (CH) units per Cs implying y=0.15. Reflections with nonzero L are significantly less intense than calculated neglecting the Debye-Waller factor, indicating large-amplitude c-axis thermal motion of Cs ions. The fractional linear in-plane dilation upon replacing K with Cs is within 20% of the corresponding value in graphite intercalates
Additional details
Publishing Information
- Journal Title
- Physical Review, B: Condensed Matter
- Journal Volume
- 41
- Journal Issue
- 5
- Series
- Phys. Rev., B: Condens. Matter.
- Journal Page Range
- 2971-2975
- ISSN
- 0163-1829
- CODEN
- PRBMD
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 21058066
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CESIUM ADDITIONS; CLATHRATES; CRYSTAL STRUCTURE; DOPED MATERIALS; LATTICE PARAMETERS; POLYENES; POWDERS; STRUCTURAL MODELS; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; HYDROCARBONS; MATERIALS; ORGANIC COMPOUNDS; SCATTERING