Fast versus conventional HAADF-STEM tomography of nanoparticles: advantages and challenges
Creators
- 1. NANOlab Center of Excellence, University of Antwerp (Belgium)
- 2. Electron Microscopy for Materials Science (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp (Belgium)
- 3. Thermo Fisher Scientific, Achtseweg Noord 5, 5651 GG Eindhoven (Netherlands)
Description
Highlights: • Two fast acquisition strategies for HAADF-STEM tomography series were experimentally compared to conventional HAADF-STEM tomography. • Through dedicated pre-processing, reliable reconstructions can be obtained based on the fast continuous and fast incremental series. • The fast approaches show great promise for accelerating the tomographic experiment by approximately a factor of 10, and lowering the electron dose by a factor of 2. HAADF-STEM tomography is a widely used experimental technique for analyzing nanometer-scale structures of a large variety of materials in three dimensions. It is especially useful for studying crystalline nanoparticles, where conventional TEM tomography suffers from diffraction-related artefacts. Unfortunately, the acquisition of a HAADF-STEM tilt series can easily take up one hour or more, depending on the complexity of the experiment. It is therefore challenging to investigate samples that do not withstand long electron beam illumination or to acquire a large number of tilt series during a single TEM experiment. The latter would facilitate obtaining more statistically representative 3D data, and enable performing dynamic in situ 3D characterizations with a finer time resolution. Various HAADF-STEM acquisition strategies have been proposed to accelerate the tomographic acquisition and reduce the required electron dose. These methods include tilting the holder continuously while acquiring a projection "movie" and a hybrid, incremental, methodology which combines the benefits of the conventional and continuous technique. However, until now an experimental evaluation of these techniques has been lacking. In this paper, the different acquisition strategies will be experimentally compared in terms of speed, resolution and electron dose. This evaluation will be performed based on experimental tilt series, acquired for various metallic nanoparticles with different shapes and sizes. We discuss the necessary data processing and provide a general guideline that can be used to determine the most optimal acquisition strategy for specific electron tomography experiments.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.ultramic.2020.113191Additional details
Identifiers
- DOI
- 10.1016/j.ultramic.2020.113191;
- PII
- S0304399120303338;
Publishing Information
- Journal Title
- Ultramicroscopy (Amsterdam)
- Journal Volume
- 221
- Journal Page Range
- vp.
- ISSN
- 0304-3991
- CODEN
- ULTRD6
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 54112377
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- DATA PROCESSING; DIFFRACTION; ELECTRON BEAMS; ELECTRONS; ILLUMINANCE; MATERIALS; NANOPARTICLES; RECOMMENDATIONS; TIME RESOLUTION; TOMOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- BEAMS; COHERENT SCATTERING; DIAGNOSTIC TECHNIQUES; ELECTRON MICROSCOPY; ELEMENTARY PARTICLES; FERMIONS; LEPTON BEAMS; LEPTONS; MICROSCOPY; PARTICLE BEAMS; PARTICLES; PROCESSING; RESOLUTION; SCATTERING; TIMING PROPERTIES
Optional Information
- Copyright
- Copyright (c) 2020 Elsevier B.V. All rights reserved.