Hard TiCx/SiC/a-C:H nanocomposite thin films using pulsed high energy density plasma focus device
Creators
- 1. Department of Physics, GC University, Lahore 54000 (Pakistan)
- 2. NSSE, National Institute of Education, Nanyang Technological University, Singapore 637616 (Singapore)
- 3. School of Materials Science and Engineering, Nanyang Technological University, Nanyang Avenue, Singapore 639798 (Singapore)
- 4. Centre for Advanced Studies in Physics (CASP), GC University, Lahore 54000 (Pakistan)
- 5. Institute of Materials Research and Engineering, A-STAR (Agency for Science, Technology and Research), 3 Research Link, Singapore 117602 (Singapore)
Description
Highlights: •The energetic ions and electron beams are used to synthesize TiCx/SiC/a-C:H films. •As-deposited crystalline and hard nanocomposite TiCx/SiC/a-C:H films are synthesized. •Very high average deposition rates of 68 nm/shot are achieved using dense plasma focus. •The maximum hardness of 22 GPa is achieved at the surface of the film. -- Abstract: Thin films of TiCx/SiC/a-C:H were synthesized on Si substrates using a complex mix of high energy density plasmas and instability accelerated energetic ions of filling gas species, emanated from hot and dense pinched plasma column, in dense plasma focus device. The conventional hollow copper anode of Mather type plasma focus device was replaced by solid titanium anode for synthesis of TiCx/SiC/a-C:H nanocomposite thin films using CH4:Ar admixture of (1:9, 3:7 and 5:5) for fixed 20 focus shots as well as with different number of focus shots with fixed CH4:Ar admixture ratio 3:7. XRD results showed the formation of crystalline TiCx/SiC phases for thin film synthesized using different number of focus shots with CH4:Ar admixture ratio fixed at 3:7. SEM results showed that the synthesized thin films consist of nanoparticle agglomerates and the size of agglomerates depended on the CH4:Ar admixture ratio as well as on the number of focus shots. Raman analysis showed the formation of polycrystalline/amorphous Si, SiC and a-C for different CH4:Ar ratio as well as for different number of focus shots. The XPS analysis confirmed the formation of TiCx/SiC/a-C:H composite thin film. Nanoindentation results showed that the hardness and elastic modulus values of composite thin films increased with increasing number of focus shots. Maximum values of hardness and elastic modulus at the surface of the composite thin film were found to be about 22 and 305 GPa, respectively for 30 focus shots confirming the successful synthesis of hard composite TiCx/SiC/a-C:H coatings
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nimb.2013.03.007Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2013.03.007;
- PII
- S0168-583X(13)00269-3;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 301
- Journal Page Range
- p. 53-61
- ISSN
- 0168-583X
- CODEN
- NIMBEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45065067
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- ELECTRON BEAMS; HARDNESS; METHANE; PLASMA FOCUS; PLASMA FOCUS DEVICES; PRESSURE RANGE GIGA PA; SCANNING ELECTRON MICROSCOPY; SILICON CARBIDES; TAIL IONS; THIN FILMS; TITANIUM CARBIDES; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- ALKANES; BEAMS; CARBIDES; CARBON COMPOUNDS; CHARGED PARTICLES; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; FILMS; HYDROCARBONS; IONS; LEPTON BEAMS; MECHANICAL PROPERTIES; MICROSCOPY; OPEN PLASMA DEVICES; ORGANIC COMPOUNDS; PARTICLE BEAMS; PHOTOELECTRON SPECTROSCOPY; PRESSURE RANGE; SCATTERING; SILICON COMPOUNDS; SPECTROSCOPY; THERMONUCLEAR DEVICES; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.