Published February 2003 | Version v1
Journal article

Quantitative characterisation of chemical inhomogeneities in Al-Ag using high-resolution Z-contrast STEM

Description

The incoherent imaging model is applied to interpret high-resolution Z-contrast micrographs. A simple method for a column-by-column resolved characterisation of Ag-rich precipitates in Al-Ag is developed. No information on the detailed imaging process is required. Evaluating the high-angle scattering intensities of Al and Ag by image analysis, the number of Ag atoms contained in individual atomic columns can be determined accurately and moreover, the thickness of the thin foil can be calculated. Multislice simulations confirm the broad validity of the incoherent imaging model for Z-contrast STEM and are used to check the method presented. Finally, the image analysis is applied to experimental Z-contrast images of Guinier-Preston zones in Al-3 at% Ag. The Ag content of the individual atomic columns can be determined with an accuracy better than ±10%

Additional details

Identifiers

PII
S0304399102002498;

Publishing Information

Journal Title
Ultramicroscopy (Amsterdam)
Journal Volume
94
Journal Issue
2
Journal Page Range
p. 125-133
ISSN
0304-3991
CODEN
ULTRD6

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37036596
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
ACCURACY; ALUMINIUM; ATOMS; FOILS; GUINIER-PRESTON ZONES; IMAGES; RESOLUTION; SILVER; SIMULATION; THICKNESS; TRANSMISSION ELECTRON MICROSCOPY
Descriptors DEC
DIMENSIONS; ELECTRON MICROSCOPY; ELEMENTS; METALS; MICROSCOPY; TRANSITION ELEMENTS; ZONES

Optional Information

Copyright
Copyright (c) 2002 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.