Published December 2018
| Version v1
Book
Dead layer thickness measurement in p-type point contact Germanium detector
- 1. Department of Physics, Institute of Science, Banaras Hindu University, Varanasi (India)
- 2. Institute of Physics, Academia Sinica, Taipei - 11529 (China)
Description
P-type point-contact Germanium (pGe) detectors have excellent properties for the studies of low energy neutrino physics, WIMP dark matter search and other physics searches beyond the standard model at the Kuo-Sheng Reactor Neutrino Laboratory (KSNL). A small area of the point-contact electrode, which can significantly reduce the internal capacitance, results in reduction of low electronic noise and energy threshold. The p-type point-contact Ge (pGe) detectors have an inactive layer at the surface caused by lithium diffusion
Additional details
Publishing Information
- Publisher
- Bhabha Atomic Research Centre
- Imprint Place
- Mumbai (India)
- Imprint Title
- Proceedings of the DAE international symposium on nuclear physics. V. 63
- Imprint Pagination
- 1300 p.
- Journal Page Range
- p. 1036-1037
Conference
- Title
- 63. DAE international symposium on nuclear physics
- Dates
- 10-14 Dec 2018
- Place
- Mumbai (India)
INIS
- Country of Publication
- India
- Country of Input or Organization
- India
- INIS RN
- 50012015
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CHARGE COLLECTION; DESIGN; ELECTRIC FIELDS; GE SEMICONDUCTOR DETECTORS; P-TYPE CONDUCTORS; THRESHOLD ENERGY
- Descriptors DEC
- ENERGY; MATERIALS; MEASURING INSTRUMENTS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SEMICONDUCTOR MATERIALS
Optional Information
- Notes
- 4 refs., 3 figs., 1 tab.