Published December 2018 | Version v1
Book

Dead layer thickness measurement in p-type point contact Germanium detector

  • 1. Department of Physics, Institute of Science, Banaras Hindu University, Varanasi (India)
  • 2. Institute of Physics, Academia Sinica, Taipei - 11529 (China)

Description

P-type point-contact Germanium (pGe) detectors have excellent properties for the studies of low energy neutrino physics, WIMP dark matter search and other physics searches beyond the standard model at the Kuo-Sheng Reactor Neutrino Laboratory (KSNL). A small area of the point-contact electrode, which can significantly reduce the internal capacitance, results in reduction of low electronic noise and energy threshold. The p-type point-contact Ge (pGe) detectors have an inactive layer at the surface caused by lithium diffusion

Part of:
Proceedings of the DAE international symposium on nuclear physics. V. 63

Additional details

Publishing Information

Publisher
Bhabha Atomic Research Centre
Imprint Place
Mumbai (India)
Imprint Title
Proceedings of the DAE international symposium on nuclear physics. V. 63
Imprint Pagination
1300 p.
Journal Page Range
p. 1036-1037

Conference

Title
63. DAE international symposium on nuclear physics
Dates
10-14 Dec 2018
Place
Mumbai (India)

INIS

Country of Publication
India
Country of Input or Organization
India
INIS RN
50012015
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CHARGE COLLECTION; DESIGN; ELECTRIC FIELDS; GE SEMICONDUCTOR DETECTORS; P-TYPE CONDUCTORS; THRESHOLD ENERGY
Descriptors DEC
ENERGY; MATERIALS; MEASURING INSTRUMENTS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SEMICONDUCTOR MATERIALS

Optional Information

Notes
4 refs., 3 figs., 1 tab.