Published December 15, 2009
| Version v1
Journal article
Electron spectroscopies for simultaneous chemical and electrical analysis
Creators
- 1. Department of Materials Science and Engineering, University of Delaware, Newark, DE 19711 (United States)
Description
Electrons are used as spectroscopic probes to determine elemental composition and chemistry, and are also useful as probes of the electrical properties of devices and materials. In this paper, four examples with incident and emitted electrons were used to evaluate the electrical and chemical properties of samples. These examples were the electrical conductivity of an Ag-epoxy composite, the electric field in an avalanche photodiode near breakdown, the mechanism of conductivity of semi-insulating polycrystalline films, and the charge at an oxide/semiconductor interface for high-k applications. This kind of work is very much in the spirit of the work done by Prof. Sefik Suzer.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2009.10.048Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2009.10.048;
- PII
- S0169-4332(09)01493-7;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 256
- Journal Issue
- 5
- Journal Page Range
- p. 1313-1315
- ISSN
- 0169-4332
- CODEN
- ASUSEE
Conference
- Title
- Symposium on surface science 2008 for Festschrift in honor of Professor Sefik Suzer's 60. birthday
- Dates
- 21 Mar 2008
- Place
- Ankara (Turkey)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44018354
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- AUGER ELECTRON SPECTROSCOPY; BREAKDOWN; CHEMICAL PROPERTIES; ELECTRIC CONDUCTIVITY; ELECTRIC FIELDS; EPOXIDES; EQUIPMENT; FILMS; INTERFACES; OXIDES; POLYCRYSTALS; SEMICONDUCTOR MATERIALS; SILICON; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CHALCOGENIDES; CRYSTALS; ELECTRICAL PROPERTIES; ELECTRON SPECTROSCOPY; ELEMENTS; MATERIALS; ORGANIC COMPOUNDS; ORGANIC OXYGEN COMPOUNDS; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; PHYSICAL PROPERTIES; SEMIMETALS; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.