Published 2002
| Version v1
Miscellaneous
Morphology of thin layers of LiF on Si(001) substrate
Creators
- 1. Instytut Fizyki Doswiadczalnej, Uniwersytet Wroclawski, Wroclaw (Poland)
Description
no abstract available
Additional details
Additional titles
- Original title (Polish)
- Morfologia cienkich warstw na podlozu Si(001)
Publishing Information
- Imprint Title
- Abstracts book of 2. Seminar on Studies Carried out by Means of Short-Range Scanning Microscopy - STM/AFM 2002
- Imprint Pagination
- [Z1-Z9];[U1-U22];[P1-P26]
- Journal Page Range
- p. U8
Conference
- Title
- 2. Seminar on Studies Carried out by Means of Short-Range Scanning Microscopy - STM/AFM 2002
- Original Conference Title
- 2. Seminarium Badania prowadzone metodami skaningowej mikroskopii bliskich oddzialywan
- Dates
- 4-8 Dec 2002
- Place
- Zakopane (Poland)
INIS
- Country of Publication
- Poland
- Country of Input or Organization
- Poland
- INIS RN
- 34075065
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- No Abstract, Conference, Non-conventional Literature
- Descriptors DEI
- ATOMIC FORCE MICROSCOPY; AUGER ELECTRON SPECTROSCOPY; ELECTRON DIFFRACTION; FABRICATION; LAYERS; LITHIUM FLUORIDES; MORPHOLOGY; SILICON; STRESS RELAXATION; SUBSTRATES; SURFACE COATING; THIN FILMS
- Descriptors DEC
- ALKALI METAL COMPOUNDS; COHERENT SCATTERING; DEPOSITION; DIFFRACTION; ELECTRON SPECTROSCOPY; ELEMENTS; FILMS; FLUORIDES; FLUORINE COMPOUNDS; HALIDES; HALOGEN COMPOUNDS; LITHIUM COMPOUNDS; LITHIUM HALIDES; MICROSCOPY; RELAXATION; SCATTERING; SEMIMETALS; SPECTROSCOPY
Optional Information
- Notes
- Imprint:Zbior streszczen 2. Seminarium Badania prowadzone metodami skaningowej mikroskopii bliskich oddzialywan