Published November 1988 | Version v1
Journal article

Progress in field ion microscopy imaging of high-Tc superconducting oxides

  • 1. National Bureau of Standards, Gaithersburg, MD (USA)

Description

Field ion microscopy (FIM) of many of the new high-transition-temperature superconducting oxides has become routine. The older La-Sr-Cu-O type and the newer R-Ba-Cu-O (''1, 2, 3'') type, with R=Y, Yb, Sm, Gd, Dy, Ho, Er, Pr, Eu or La, consistently image well at low temperature in hydrogen FIM and argon FIM at higher temperatures, and less consistently in neon FIM. The newest Bi-Sr-Ca-Cu-O type and Tl-Ba-Ca-Cu-0 type) can be imaged by hydrogen FIM, but the Bi-based specimens thus far have been mechanically weak and phase identification in both types poses a significant problem. Some details of FIM image interpretation for the ''1, 2, 3'' superconductors are addressed, in particular, the various degrees of order apparent in the images and the question of identity of the imaging species

Additional details

Publishing Information

Journal Title
Journal de Physique (Les Ulis), Colloque
Journal Volume
49
Journal Issue
C6
Series
J. Phys. (Les Ulis), Colloq.
Journal Page Range
C6.459-C6.464
ISSN
0449-1947
CODEN
JPQCA

Conference

Title
35. International field emission Symposium.
Dates
18-22 Jul 1988.
Place
Oak Ridge, TN (USA).