Recent Developments in Synchrotron Moessbauer Reflectometry

Synchrotron Moessbauer Reflectometry (SMR), the grazing incidence nuclear resonant scattering of synchrotron radiation, can be applied to perform depth-selective phase analysis and to determine the isotopic and magnetic structure of thin films and multilayers. Principles and methodological aspects of SMR are briefly reviewed. Off-specular SMR provides information from the lateral structure of multilayers. In anti-ferromagneticly coupled systems the size of magnetic domains can be measured.