Published November 28, 2008 | Version v1
Journal article

Thermal decomposition routes of CrN hard coatings synthesized by reactive arc evaporation and magnetron sputtering

  • 1. Christian Doppler Laboratory for Advanced Hard Coatings, Department of Physical Metallurgy and Materials Testing, Franz-Josef Strasse 18, University of Leoben, 8700 Leoben (Austria)
  • 2. Materials Center Leoben, Franz-Josef Strasse 13, 8700 Leoben (Austria)
  • 3. Institute of Mineralogy and Petrography, University of Innsbruck, Innrain 52, 6020 Innsbruck (Austria)
  • 4. Department of Physical Metallurgy and Materials Testing, Franz-Josef Strasse 18, University of Leoben, 8700 Leoben (Austria)

Description

This study presents a comparison of the thermal decomposition of CrN hard coatings synthesized by reactive arc evaporation and magnetron sputtering. Structural changes in the coating material were determined by in-situ high-temperature X-ray diffraction and correlated to the results of simultaneous thermal analysis. Annealing temperatures up to 1440 deg. C in Ar and a variation in heating rates gave insights to the different decomposition kinetics for the material deposited by reactive arc evaporation and magnetron sputtering. Both single-phase CrN coatings start to decompose above 925 deg. C under release of nitrogen in two major reaction steps to pure Cr via the intermediate step of Cr2N. While the kinetics for the first decomposition reaction from CrN to Cr2N is different for both samples, the second step from Cr2N into Cr is similar. This behavior can be understood considering the differences in structure, composition, and morphology of both as-deposited coatings and their evolution during thermal analysis

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2008.06.086

Additional details

Identifiers

DOI
10.1016/j.tsf.2008.06.086;
PII
S0040-6090(08)00721-9;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
517
Journal Issue
2
Journal Page Range
p. 568-574
ISSN
0040-6090
CODEN
THSFAP

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.