Upgrade of the Automatic Analysis System in the TJ-II Thomson Scattering Diagnostic: New Image Recognition Classifier and Fault Condition Detection

Full text of publication follows: An automatic image classification system has been in operation for years in the TJ-II Thomson diagnostic. It recognizes five different types of images: CCD camera background, measurement of stray light without plasma or in a collapsed discharge, image during ECH phase, image during NBI phase and image after reaching the cut o density during ECH heating. Each kind of image implies the execution of different application software. Therefore, the classification system was developed to launch the corresponding software in an automatic way. The method to recognize the several classes was based on a learning system, in particular Support Vector Machines (SVM). Since the first implementation of the classifier, a relevant improvement has been accomplished in the diagnostic: a new notch filter is in operation, having a larger stray-light rejection at the ruby wavelength than the previous filter. On the other hand, its location in the optical system has been modified. As a consequence, the stray light pattern in the CCD image is located in a different position. In addition to these transformations, the power of neutral beams injected in the TJ-II plasma has been increased about a factor of 2. Due to the fact that the recognition system is based on a learning system and major modifications have been carried out in both the diagnostic (optics) and TJ-II plasmas (injected power), the classifier model is no longer valid. The creation of a new model (also based on SVM) under the present conditions has been necessary. Finally, specific error conditions in the data acquisition process can automatically be detected now. The recovering process can be automated, thereby avoiding the loss of data in ensuing discharges. (authors)