The HARP TPC laser calibration system
Creators
Description
A novel apparatus for the calibration of the HARP Time Projection Chamber has been designed, developed and built. The apparatus consists of a large number of point-like photo-electron sources located at precise positions inside the detector volume. The photo-electron sources are optical quartz fibers on which one end is coated with an aluminum layer of ∼80 A thickness and are held in place on the high-voltage membrane. The fibers are used to guide UV laser light pulses that generate photoelectrons on the fiber tips acting as photo-electron emitters. The photo-electrons drift inside the detector and produce the calibration signals. The technique allows to assess ExB distortions and to measure drift velocity, ion feedback and time stability in real time
Additional details
Identifiers
- DOI
- 10.1016/j.nima.2003.10.041;
- PII
- S0168900203027529;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 518
- Journal Issue
- 1-2
- Journal Page Range
- p. 132-134
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- Frontier detectors for frontier physics
- Acronym
- 9. Pisa meting on advanced detectors
- Dates
- 25-31 May 2003
- Place
- La Biodola, Isola d'Elba (Italy)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Romania
- INIS RN
- 35030045
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALUMINIUM; ANALOG SYSTEMS; CALIBRATION; COMPUTER ARCHITECTURE; ELECTRON EMISSION; INTEGRATED CIRCUITS; ION DRIFT; LASERS; LAYERS; MICROPROCESSORS; OPTICAL FIBERS; PHOTOELECTRIC EMISSION; QUARTZ; READOUT SYSTEMS; REAL TIME SYSTEMS; TIME PROJECTION CHAMBERS; TIMING PROPERTIES; ULTRAVIOLET RADIATION
- Descriptors DEC
- DRIFT CHAMBERS; ELECTROMAGNETIC RADIATION; ELECTRON EMISSION; ELECTRONIC CIRCUITS; ELEMENTS; EMISSION; FIBERS; MEASURING INSTRUMENTS; METALS; MICROELECTRONIC CIRCUITS; MINERALS; MULTIWIRE PROPORTIONAL CHAMBERS; OXIDE MINERALS; PHOTOELECTRIC EFFECT; PROPORTIONAL COUNTERS; RADIATION DETECTORS; RADIATIONS
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.