Published July 1, 2018 | Version v1
Journal article

Fabrication, Microstructure and Dielectric Properties of CaTi1-x (Ni1/3Nb2/3)xO3 Ceramics

  • 1. School of Materials Science and Engineering, Guangxi Key Laboratory of Information Materials, Guilin University of Electronic Technology, Guilin 541004 (China)

Description

A series of CaTi1-x(Ni1/3Nb2/3)xO3(0.4.≤x≤0.6)ceramics were prepared through conventional solid-state reaction method. The effects of doping, sintering temperature and annealing process on the phase composition, microstructure and dielectric properties of CaTi1-x(Ni1/3Nb2/3)xO3 ceramics were investigated. The X-ray diffraction (XRD) and scanning electron microscope (SEM) analysis results indicated that all the sintered samples adopted single perovskite phase. As x increased o.4 to 0.6, εr decreased from 59.52 to 44.97, Q×f values decreased from 13736 GHz to 6420 GHz, and the τf varied from +57.6 ppm/°C to -21.0 ppm/°C. A near zeroτf of -4.8 ppm/°C, dielectric contant of 47.3 and Q×f value of 11873.2 GHz were obtained at the sintering temperature of 1540 °C. Moreover, by annealing at 1400°C, the Q×f value was improved to 16130.6GHz. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1757-899X/381/1/012019

Additional details

Publishing Information

Journal Title
IOP Conference Series. Materials Science and Engineering (Online)
Journal Volume
381
Journal Issue
1
Journal Page Range
[6 p.]
ISSN
1757-899X

Conference

Title
4. Annual International Workshop on Materials Science and Engineering
Acronym
IWMSE2018
Dates
18-20 May 2018
Place
Xi'an (China)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
52091890
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ANNEALING; CERAMICS; DIELECTRIC MATERIALS; DIELECTRIC PROPERTIES; MICROSTRUCTURE; PEROVSKITE; SCANNING ELECTRON MICROSCOPY; SINTERING; SOLIDS; X-RAY DIFFRACTION
Descriptors DEC
COHERENT SCATTERING; DIFFRACTION; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; FABRICATION; HEAT TREATMENTS; MATERIALS; MICROSCOPY; MINERALS; OXIDE MINERALS; PEROVSKITES; PHYSICAL PROPERTIES; SCATTERING