Published 1995 | Version v1
Book Metadata-only

TEM sample preparation technique for ceramic materials

Creators

  • 1. North Carolina A and T State Univ., Greensboro, NC (United States). Dept. of Mechanical Engineering

Description

Specimens suitable for transmission electron microscopy (TEM) must have a thickness of several hundred nanometers depending on the operating voltage of the instrument. An ideal specimen is thin, representative of the bulk sample, stable, clean, flat with parallel sides and free of surface segregation. The sample preparation technique varies according to the nature of the material. The preparation for a TEM sample from a tested monolithic ceramic specimen is outlined

Additional details

Publishing Information

Publisher
Technomic Publishing Company, Inc.
Imprint Place
Lancaster, PA (United States)
ISBN
1-56676-232-4
Imprint Title
Science and technology alliance -- Materials conference '93
Imprint Pagination
459 p.
Journal Page Range
p. 427-432.

Conference

Title
1993 science and technology alliance materials conference.
Dates
27-29 Oct 1993.
Place
Greensboro, NC (United States).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
26062711
Subject category
S36: MATERIALS SCIENCE; S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ALUMINIUM OXIDES; ELECTRON MICROSCOPY; ION BEAMS; MECHANICAL POLISHING; MICROSTRUCTURE; MILLING; SAMPLE PREPARATION; SILICON NITRIDES; YTTRIUM OXIDES
Descriptors DEC
ALUMINIUM COMPOUNDS; BEAMS; CHALCOGENIDES; CRYSTAL STRUCTURE; MACHINING; MICROSCOPY; NITRIDES; NITROGEN COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; PNICTIDES; POLISHING; SILICON COMPOUNDS; SURFACE FINISHING; TRANSITION ELEMENT COMPOUNDS; YTTRIUM COMPOUNDS

Optional Information

Secondary number(s)
CONF-9310328--.