Published December 2016 | Version v1
Journal article

Relationship between thermal quenching of Eu2+ luminescence and cation ordering in (Ba1−xSrx)2SiO4:Eu phosphors

Description

The thermal quenching property of phosphors has been proven to have a strong impact on the application of them. In this paper, a series of (Ba1−xSrx)2SiO4:Eu2+ compounds have been synthesized via conventional high-temperature solid-state reaction. Based on the Rietveld fitting analysis of the X-ray diffraction data, the preferential occupancy behavior of Sr2+/Ba2+ ions is verified. We adopt the cation ordering to characterize this preferential occupancy and find that the degree of cation ordering reaches its maximum at x=0.5 and decreases as x deviates from 0.5. The photoluminescence measurements show that the intermediate composition (x=0.5) exhibits the best luminescence thermal stability with T1/2 over 200 °C. The composition dependence of thermal quenching temperature is well similar to the composition dependence of the degree of cation ordering, indicating that the thermal quenching property of (Ba1−xSrx)2SiO4:Eu2+ is positively related to the cation ordering. This work provides a deeper understanding between thermal quenching properties and crystal structures of phosphors.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.jlumin.2016.08.031

Additional details

Identifiers

DOI
10.1016/j.jlumin.2016.08.031;
PII
S0022-2313(16)30611-1;

Publishing Information

Journal Title
Journal of Luminescence
Journal Volume
180
Journal Page Range
p. 163-168
ISSN
0022-2313
CODEN
JLUMA8

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
49099798
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
BARIUM IONS; CATIONS; CRYSTAL STRUCTURE; EUROPIUM IONS; PHOSPHORS; QUENCHING; STRONTIUM IONS; TEMPERATURE RANGE 0400-1000 K; X-RAY DIFFRACTION
Descriptors DEC
CHARGED PARTICLES; COHERENT SCATTERING; DIFFRACTION; IONS; SCATTERING; TEMPERATURE RANGE

Optional Information

Copyright
Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.