Synthesis and characterization of Fe100-xPtx alloy thin films
Description
Polycrystalline alloy thin films of Fe100-xPtx with various platinum compositions (x=15, 24, 46 and 78 at.%) were synthesized by magnetron sputtering. The variation of platinum content and deposition rate with the platinum area target fraction in the sputtering was studied. It is observed that the X-ray diffraction patterns of as-deposited FePt films with all compositions exhibited a disordered phase with fcc structure. The effects of annealing on the crystal structure and morphology are studied. Annealing of Fe54Pt46 films at high temperatures yielded an ordered L10 γ2 phase with face centered tetragonal (fct) structure. Differential scanning calorimetric (DSC) studies reveal exothermic peaks for phase transformation in different alloy compositions. The activation energies of phase transformations are estimated and the results are discussed
Additional details
Identifiers
- DOI
- 10.1016/S0254-0584(03)00140-8;
- arXiv
- arXiv:hep-ph/9603272v2;
- PII
- S0254058403001408;
Publishing Information
- Journal Title
- Materials Chemistry and Physics
- Journal Volume
- 82
- Journal Issue
- 2
- Journal Page Range
- p. 335-340
- ISSN
- 0254-0584
- CODEN
- MCHPDR
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38075656
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ACTIVATION ENERGY; ANNEALING; CALORIMETRY; DEPOSITION; FCC LATTICES; IRON ALLOYS; MAGNETIC MATERIALS; MAGNETRONS; MICROSTRUCTURE; PHASE TRANSFORMATIONS; PLATINUM ALLOYS; POLYCRYSTALS; SPUTTERING; SYNTHESIS; THIN FILMS; X-RAY DIFFRACTION
- Descriptors DEC
- ALLOYS; COHERENT SCATTERING; CRYSTAL LATTICES; CRYSTAL STRUCTURE; CRYSTALS; CUBIC LATTICES; DIFFRACTION; ELECTRON TUBES; ELECTRONIC EQUIPMENT; ENERGY; EQUIPMENT; FILMS; HEAT TREATMENTS; MATERIALS; MICROWAVE EQUIPMENT; MICROWAVE TUBES; PLATINUM METAL ALLOYS; SCATTERING; TRANSITION ELEMENT ALLOYS
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.