Superdeformation studies in the mass-190 region using the new Ge arrays
Description
Several new experiments have been performed at GAMMASPHERE and EUROGAM on nuclei in the mass 190 region in order to reexamine the properties of superdeformed nuclei in this region with the greater sensitivity supplied by these new arrays. These experiments on 190,192,194Hg have utilized both self supporting and Au backed targets depending on the experimental quantities of interest. In the case of backed targets, the data analysis has concentrated on identifying both continuum structures and discrete transitions associated with the decay of the superdeformed band to the ground state, as well as extracting lifetime information on the individual states of the SD bands via the doppler shift attenuation method. In the case of the thin target experiments, emphasis has been placed on extending the known superdeformed bands to higher spin and searching for new SD bands in the data. The new results to be discussed and contrasted with data taken With past generation arrays on these same nuclei
Additional details
Publishing Information
- Journal Title
- Bulletin of the American Physical Society
- Journal Volume
- 38
- Journal Issue
- 9
- Journal Page Range
- p. 1793.c.
- ISSN
- 0003-0503
- CODEN
- BAPSA6
Conference
- Title
- Fall meeting of the Division of Nuclear Physics of the American Physical Society.
- Dates
- 20-23 Oct 1993.
- Place
- Pacific Grove, CA (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 28010215
- Subject category
- S73: NUCLEAR PHYSICS AND RADIATION PHYSICS; S73: NUCLEAR PHYSICS AND RADIATION PHYSICS; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- GAMMA SPECTROSCOPY; GE SEMICONDUCTOR DETECTORS; HIGH SPIN STATES; MERCURY ISOTOPES; NUCLEAR DEFORMATION; NUCLEAR STRUCTURE
- Descriptors DEC
- DEFORMATION; ENERGY LEVELS; MEASURING INSTRUMENTS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SPECTROSCOPY
Optional Information
- Secondary number(s)
- CONF-931044--.