Simplified x-ray multilayer reflectivity calculations using lossy transmission line theory

Lossy transmission line theory is shown to be a physically meaningful technique for calculating the reflectivity of thin-film multilayer structures with complex indices of refraction. The problem is approached by treating each layer as a transmission line characterized by a given impedance. Reflections are naturally due to impedance mismatches; the impedance is shown to be simply the ratio of the electric and magnetic fields of the plane waves. Both normal and oblique incidence results match conventional calculations, but the transmission line approach requires minimal coding