Published June 2004
| Version v1
Journal article
Development of single-ion hit techniques and their applications at TIARA of JAERI Takasaki
Description
At TIARA facility in JAERI Takasaki, the single-ion hit technique combined with heavy ion microbeam has evolved in conjunction with developments in applied research such as the study of single-ion irradiation effects in semiconductors or biological cells. This technique is the most effective tool for the investigation of individual phenomena induced by single-ion injections to local areas of those samples, which have micron-scale structures. Adding a feature of position detection for the study of single event effects in semiconductor nano- or quantum devices is regarded as the next stage in the development of the single-ion hit technique
Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2004.01.205;
- PII
- S0168583X04002551;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 219-220
- Journal Issue
- 4
- Journal Page Range
- p. 1010-1014
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 16. international conference on ion beam analysis
- Dates
- 29 Jun - 4 Jul 2003
- Place
- Albuquerque, NM (United States)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Brazil
- INIS RN
- 35105773
- Subject category
- S43: PARTICLE ACCELERATORS; S63: RADIATION, THERMAL, AND OTHER ENVIRONMENTAL POLLUTANT EFFECTS ON LIVING ORGANISMS AND BIOLOGICAL MATERIALS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BIOLOGICAL RADIATION EFFECTS; HEAVY ION SPECTROMETERS; ION BEAMS; ION MICROPROBE ANALYSIS; JAERI TANDEM ACCELERATOR; NANOSTRUCTURES; POSITION SENSITIVE DETECTORS; SEMICONDUCTOR DEVICES
- Descriptors DEC
- ACCELERATORS; BEAMS; BIOLOGICAL EFFECTS; CHEMICAL ANALYSIS; ELECTROSTATIC ACCELERATORS; MEASURING INSTRUMENTS; MICROANALYSIS; NONDESTRUCTIVE ANALYSIS; RADIATION DETECTORS; RADIATION EFFECTS; SPECTROMETERS; TANDEM ELECTROSTATIC ACCELERATORS; VAN DE GRAAFF ACCELERATORS
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.