Published July 2010 | Version v1
Journal article

Burgers vector population, dislocation types and dislocation densities in single grains extracted from a polycrystalline commercial-purity Ti specimen by X-ray line-profile analysis

  • 1. Department of Materials Physics, Eoetvoes University Budapest H-1518, POB 32, Budapest (Hungary)
  • 2. Air Force Research Laboratory, Materials and Manufacturing Directorate, Wright-Patterson Air Force Base, OH 45433 (United States)
  • 3. European Synchrotron Research Facility, B. P. 220, F-38043 Grenoble Cedex (France)

Description

Burgers vector populations, dislocation types and dislocation densities are determined within individual grains of a polycrystalline commercial-purity titanium specimen by extending prior method of differentiating individual grains in a polycrystalline sample. The procedure has been tested at the focused X-ray beamline ID11 at the European Synchrotron Research Facility in Grenoble, France. The results provided by the method can be used as input for different crystal-plasticity calculations and for the experimental verification of numerical simulations.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.scriptamat.2010.03.016

Additional details

Identifiers

DOI
10.1016/j.scriptamat.2010.03.016;
PII
S1359-6462(10)00154-5;

Publishing Information

Journal Title
Scripta Materialia
Journal Volume
63
Journal Issue
1
Journal Page Range
p. 69-72
ISSN
1359-6462
CODEN
SCMAF7

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
45024298
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
BURGERS VECTOR; COMPUTERIZED SIMULATION; DISLOCATIONS; GRAIN SIZE; LINE BROADENING; PLASTICITY; POLYCRYSTALS; TITANIUM; X-RAY DIFFRACTION
Descriptors DEC
COHERENT SCATTERING; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; CRYSTALS; DIFFRACTION; ELEMENTS; LINE DEFECTS; MECHANICAL PROPERTIES; METALS; MICROSTRUCTURE; SCATTERING; SIMULATION; SIZE; TRANSITION ELEMENTS

Optional Information

Copyright
Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.