Published April 15, 2003
| Version v1
Journal article
Temperature effect on the Cu2O oxide morphology created by oxidation of Cu(0 0 1) as investigated by in situ UHV TEM
Creators
Description
The temperature effect on the Cu2O oxide morphology was investigated by oxidizing Cu(1 0 0) thin films at the temperature ranging from 150 to 1000 deg. C and constant oxygen partial pressure of 5x10-4 Torr. The evolution of the oxide island size and shape was followed inside an in situ ultrahigh vacuum transmission electron microscope (UHV TEM). Of particular interest, we find that the oxide morphology can be triangular, hut, rod or pyramid shaped depending only on the oxidation temperature
Additional details
Identifiers
- DOI
- 10.1016/S0169-4332(03)00159-4;
- arXiv
- arXiv:hep-ph/9609364v1;
- PII
- S0169433203001594;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 210
- Journal Issue
- 3-4
- Journal Page Range
- p. 165-170
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38086494
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- COPPER; COPPER OXIDES; MORPHOLOGY; OXIDATION; PARTIAL PRESSURE; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- CHALCOGENIDES; CHEMICAL REACTIONS; COPPER COMPOUNDS; ELECTRON MICROSCOPY; ELEMENTS; FILMS; METALS; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; THERMODYNAMIC PROPERTIES; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.