Published January 30, 2008 | Version v1
Journal article

Electrical transport studies of individual IrO2 nanorods and their nanorod contacts

  • 1. Institute of Physics, National Chiao Tung University, Hsinchu 30010, Taiwan (China)
  • 2. Department of Electrophysics, National Chiao Tung University, Hsinchu 30010, Taiwan (China)
  • 3. Department of Electronic Engineering, National Taiwan University of Science and Technology, Taipei 106, Taiwan (China)

Description

We have studied the electrical transport properties of individual single-crystalline IrO2 nanorods prepared by the metal-organic chemical vapour deposition method. With the help of the standard electron-beam lithographic technique, individual nanorods are contacted by Cr/Au submicron electrodes from above. Utilizing two-probe, three-probe and four-probe measurement configurations, not only the intrinsic electrical transport properties of the individual nanorods but also the electronic contact resistances, Rc(T), have been determined from 300 K down to liquid-helium temperatures. Our measured resistivity behaviour of the nanorods is in close agreement with the current theoretical understanding of this rutile material. On the other hand, we found that the temperature behaviour of the electronic contact resistance obeys the law log Rc∝T-1/2 over an extremely wide temperature range, from approximately 100 K down to liquid-helium temperatures. This latter conduction process is ascribed to the hopping of electrons through nanoscale Cr granules and/or an amorphous coating incidentally formed at the interface between the submicron Cr/Au electrode and the nanorod

Additional details

Identifiers

DOI
10.1088/0957-4484/19/04/045711;
PII
S0957-4484(08)51313-4;

Publishing Information

Journal Title
Nanotechnology (Print)
Journal Volume
19
Journal Issue
4
Journal Page Range
p. 045711
ISSN
0957-4484