XUV spectral observations with two-wavelength laser irradiation
- 1. Naval Research Laboratory, Washington, DC 20375-5000
Description
XUV diagnostic equipment was designed and utilized on the OMEGA target chamber at the University of Rochester to study high atomic number plasma generation by two-wavelength laser excitation. Spectral data were collected from silver tracer dot targets irradiated with 1/3 TW of 0.35-μm laser light of the multiple-beam OMEGA laser and the single synchronized 1.06-μm beam of the GDL laser for generating energetic electrons. XUV spectral data in the 30--300-A region were obtained with both a 3-m grazing incidence spectrograph and a compact 1-m grazing incidence spectrograph designed for reentrant mounting in the OMEGA chamber. High-resolution x-ray spectra were acquired in the 3.6--4.2-A region with a dual, flat-diffraction crystal spectrograph. A low-resolution x-ray spectrum of silver was recorded with a curved mica spectrograph. Some x-ray spectral lines appeared only when both OMEGA and GDL beams were used. These were identified as 2p--3s,3d transitions in F-like Ag XXXIX. F-, Na-, and Mg-like lines were found in the grazing incidence spectra, with F-like lines appearing only with 1.06-μm irradiation
Additional details
Publishing Information
- Journal Title
- Rev. Sci. Instrum.
- Journal Volume
- 59
- Journal Issue
- 8
- Series
- Rev. Sci. Instrum.
- Journal Page Range
- 1837-1839
- ISSN
- 0034-6748
- CODEN
- RSINA
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 19097124
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY; S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Descriptors DEI
- ATOMIC IONS; LASER-PRODUCED PLASMA; OMEGA FACILITY; PLASMA DIAGNOSTICS; ULTRAVIOLET SPECTRA; ULTRAVIOLET SPECTROMETERS
- Descriptors DEC
- CHARGED PARTICLES; IONS; MEASURING INSTRUMENTS; PLASMA; SPECTRA; SPECTROMETERS