Thermoelectric behavior of a multivallied semiconductor
Creators
- 1. Univ. of Wales Inst, of Science and Technology, Cardiff, Wales
Description
Following the usual procedure for including the effects of a multivallied energy band structure, the ratio (ZT) /SUB mv/ /(ZT) /SUB sv/ has been obtained as a function of reduced Fermi energy (xi), where (ZT) /SUB mv/ and (ZT) /SUB sv/ refer to the dimensionless thermoelectric figure of merit of a multivallied and single vallied semiconductor respectively, both with and without intervalley scattering. The results obtained agree with those previously reported in the limit of non degeneracy but the effectiveness of a multivallied structure in improving the figure of merit is reduced with increasing xi. It is concluded that at xi /SUB opt/ it is still an advantage to use a multivallied semiconductor while the inclusion of intervalley scattering may decrease (ZT) /SUB mv/ /(ZT) /SUB sv/ by about 25-30 percent
Additional details
Publishing Information
- Publisher
- Univ. of Texas.
- Imprint Place
- Arlington, TX (USA)
- Imprint Title
- Fifth International Conference on Thermoelectric Energy Conversion
- Journal Page Range
- p. 38-40.
Conference
- Title
- 5. international conference on thermoelectric energy conversion.
- Dates
- 14-16 Mar 1984.
- Place
- Arlington, TX (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 17008050
- Subject category
- S30: DIRECT ENERGY CONVERSION; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CRYSTAL STRUCTURE; ENERGY GAP; SCATTERING; SEMICONDUCTOR MATERIALS; THERMOELECTRIC PROPERTIES
- Descriptors DEC
- ELECTRICAL PROPERTIES; MATERIALS; PHYSICAL PROPERTIES