Published June 1, 1990
| Version v1
Journal article
General considerations for the ''Symposium on correlated transfer/excitation and autoionization''
Description
This paper discusses the general aspects of correlated transfer/excitation and autoionization. The close relatioship between dielectronic recombination (DR) and resonant transfer and excitation (RTE) is reviewed and competing processes are considered. Several ''electron-ion like'' aspects of ion-atom collisions are identified and their significance discussed
Additional details
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 205
- Journal Issue
- 1
- Series
- AIP Conf. Proc.
- Journal Page Range
- 538-543
- ISSN
- 0094-243X
- CODEN
- APCPC
Conference
- Title
- 16. international conference on the physics of electronic and atomic collisions.
- Dates
- 25 Jul - 1 Aug 1989.
- Place
- New York, NY (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 22039368
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Resource subtype / Literary indicator
- Conference, Numerical Data
- Descriptors DEI
- AUTOIONIZATION; CROSS SECTIONS; ELECTRON CAPTURE; EXCITATION; EXPERIMENTAL DATA; HELIUM; ION-ATOM COLLISIONS; RESONANCE; SILICON IONS
- Descriptors DEC
- ATOM COLLISIONS; ATOMIC IONS; CAPTURE; CHARGED PARTICLES; COLLISIONS; DATA; ELEMENTS; ENERGY-LEVEL TRANSITIONS; INFORMATION; ION COLLISIONS; IONIZATION; IONS; NONMETALS; NUMERICAL DATA; RARE GASES
Optional Information
- Secondary number(s)
- CONF-890708--.