Published October 2014 | Version v1
Journal article

Resonant cavity-enhanced quantum dot field-effect transistor as a single-photon detector

  • 1. Laboratory of Nanotechnology and Microsystems, Mechanical Engineering College, Shijiazhuang 050000 (China)
  • 2. Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083 (China)

Description

A resonant cavity-enhanced (RCE) quantum dot (QD) field-effect transistor (RCEQDFET) is designed for single-photon detection in this paper. Adding distributed Bragg reflection (DBR) mirrors to the single-photon detector (SPD), we improve the light absorption efficiency of the SPD. The effects of the reflectivity of the mirrors, the thickness and light absorption coefficient of the absorbing layer on the detector's light absorption efficiency are investigated, and the resonant cavity is determined by using the air/semiconductor interface as the mirror on the top. Through analyzing the relationship between the refractive index of Alx:Ga1−x:As and Al component, we choose AlAs/Al0.15Ga0.85As as the material of the mirror on the bottom. The pairs of AlAs/Al0.15Ga0.85 As film are further determined to be 21 by calculating the reflectivity of the mirror. The detector is fabricated from semiconductor heterostructures grown by molecular beam epitaxy. The reflection spectrum, photoluminescence (PL) spectrum, photocurrent response, and channel current of the detector are tested and the results show that the RCEQDFET-SPD designed in this paper has better performances in photonic response and wavelength selection. (electromagnetism, optics, acoustics, heat transfer, classical mechanics, and fluid dynamics)

Availability note (English)

Available from http://dx.doi.org/10.1088/1674-1056/23/10/104209

Additional details

Publishing Information

Journal Title
Chinese Physics. B
Journal Volume
23
Journal Issue
10
Journal Page Range
[6 p.]
ISSN
1674-1056