Particle size distribution analysis for nano-SiO2 powder by ultra-small angle X-ray scattering (USAXS) using synchrotron radiation
Creators
- 1. Analytical Research Center, Denki Kagaku Kogyo K.K., 3-5-1 Asahi-machi, Machida, Tokyo 194-8560 (Japan)
- 2. National Institute for Material Science, SPring-8 (NIMS), 1-1-1 Kouto, Mikazuki, Hyogo 679-5148 (Japan)
Description
Ultra-small angle X-ray scattering (USAXS) experiments were conducted with the BL15XU beamline (SPring-8) to perform a particle size distribution analysis of nano-powder, i.e. aggregations of particles with dimensions on the order of nanometers. The samples measured were amorphous nano-SiO2 powders of varying specific surface areas. Since a highly collimated and high-intensity X-ray beam is available, it is possible to obtain USAXS spectra that are only slightly affected by background noise. The USAXS spectra obtained from nano-SiO2 powders were analyzed by a modified Fankuchen technique, a method for particle size distribution analysis adapted by the authors. Using this technique, particle size distribution measurements can be performed over a wide range of particle diameters from 1 to 200 nm. Since this method enables the particle size distribution of nano-powder to be accurately and easily determined, it is expected to be useful in a wide variety of fields
Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2004.09.038;
- PII
- S0169-4332(04)01398-4;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 241
- Journal Issue
- 1-2
- Journal Page Range
- p. 227-230
- ISSN
- 0169-4332
- CODEN
- ASUSEE
Conference
- Title
- 9. international symposium on advanced physical fields
- Acronym
- APF-9
- Dates
- 1-4 Mar 2004
- Place
- Tsukuba (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38060547
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BACKGROUND NOISE; PARTICLE SIZE; SILICA; SILICON OXIDES; SMALL ANGLE SCATTERING; SPECIFIC SURFACE AREA; SPRING-8 STORAGE RING; SYNCHROTRON RADIATION; X-RAY DIFFRACTION
- Descriptors DEC
- BREMSSTRAHLUNG; CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELECTROMAGNETIC RADIATION; MINERALS; NOISE; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; RADIATION SOURCES; RADIATIONS; SCATTERING; SILICON COMPOUNDS; SIZE; STORAGE RINGS; SYNCHROTRON RADIATION SOURCES
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.