Published February 28, 2005 | Version v1
Journal article

Particle size distribution analysis for nano-SiO2 powder by ultra-small angle X-ray scattering (USAXS) using synchrotron radiation

  • 1. Analytical Research Center, Denki Kagaku Kogyo K.K., 3-5-1 Asahi-machi, Machida, Tokyo 194-8560 (Japan)
  • 2. National Institute for Material Science, SPring-8 (NIMS), 1-1-1 Kouto, Mikazuki, Hyogo 679-5148 (Japan)

Description

Ultra-small angle X-ray scattering (USAXS) experiments were conducted with the BL15XU beamline (SPring-8) to perform a particle size distribution analysis of nano-powder, i.e. aggregations of particles with dimensions on the order of nanometers. The samples measured were amorphous nano-SiO2 powders of varying specific surface areas. Since a highly collimated and high-intensity X-ray beam is available, it is possible to obtain USAXS spectra that are only slightly affected by background noise. The USAXS spectra obtained from nano-SiO2 powders were analyzed by a modified Fankuchen technique, a method for particle size distribution analysis adapted by the authors. Using this technique, particle size distribution measurements can be performed over a wide range of particle diameters from 1 to 200 nm. Since this method enables the particle size distribution of nano-powder to be accurately and easily determined, it is expected to be useful in a wide variety of fields

Additional details

Identifiers

DOI
10.1016/j.apsusc.2004.09.038;
PII
S0169-4332(04)01398-4;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
241
Journal Issue
1-2
Journal Page Range
p. 227-230
ISSN
0169-4332
CODEN
ASUSEE

Conference

Title
9. international symposium on advanced physical fields
Acronym
APF-9
Dates
1-4 Mar 2004
Place
Tsukuba (Japan)

Optional Information

Copyright
Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.