Published November 2013 | Version v1
Journal article

A new strategy to diminish the 4 V voltage plateau of LiNi0.5Mn1.5O4

Description

Graphical abstract: The annealed sample LiNi0.5Mn1.5O4 cannot eliminate the 4-V voltage plateau completely. The Mg-doped compound LiNi0.5Mn1.45Mg0.05O4 can effectively diminish the 4 V voltage plateau during charge and discharge process. - Highlights: • Mg-doped compound LiNi0.5Mn1.45Mg0.05O4 was prepared. • The 4 V voltage plateau in the charge–discharge curves of LiNi0.5Mn1.45Mg0.05O4 was diminished. • Compound LiNi0.5Mn1.45Mg0.05O4 exhibited good electrochemical properties. - Abstract: As for spinel LiNi0.5Mn1.5O4, there is 4 V voltage plateau in the charge–discharge profiles. This voltage plateau can be reduced by an annealing process, however it is hard to avoid it completely. In this study, a new strategy of partial substitution for Mn by Mg is applied. There is no 4 V voltage plateau in the charge–discharge profiles of Mg-doped compound LiNi0.5Mn1.45Mg0.05O4. This compound exhibits good electrochemical properties which can be used as cathode material of lithium ion batteries. At 1 C rate, it can deliver a capacity of around 129 mAh g−1 and remain good cycle performance

Availability note (English)

Available from http://dx.doi.org/10.1016/j.materresbull.2013.07.002

Additional details

Identifiers

DOI
10.1016/j.materresbull.2013.07.002;
PII
S0025-5408(13)00590-4;

Publishing Information

Journal Title
Materials Research Bulletin
Journal Volume
48
Journal Issue
11
Journal Page Range
p. 4960-4962
ISSN
0025-5408
CODEN
MRBUAC

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
45106660
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ANNEALING; DOPED MATERIALS; ELECTRIC BATTERIES; ELECTROCHEMISTRY; INORGANIC COMPOUNDS; LITHIUM IONS; SYNTHESIS; X-RAY DIFFRACTION
Descriptors DEC
CHARGED PARTICLES; CHEMISTRY; COHERENT SCATTERING; DIFFRACTION; ELECTROCHEMICAL CELLS; ENERGY STORAGE SYSTEMS; ENERGY SYSTEMS; HEAT TREATMENTS; IONS; MATERIALS; SCATTERING

Optional Information

Copyright
Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.