A new strategy to diminish the 4 V voltage plateau of LiNi0.5Mn1.5O4
Creators
Description
Graphical abstract: The annealed sample LiNi0.5Mn1.5O4 cannot eliminate the 4-V voltage plateau completely. The Mg-doped compound LiNi0.5Mn1.45Mg0.05O4 can effectively diminish the 4 V voltage plateau during charge and discharge process. - Highlights: • Mg-doped compound LiNi0.5Mn1.45Mg0.05O4 was prepared. • The 4 V voltage plateau in the charge–discharge curves of LiNi0.5Mn1.45Mg0.05O4 was diminished. • Compound LiNi0.5Mn1.45Mg0.05O4 exhibited good electrochemical properties. - Abstract: As for spinel LiNi0.5Mn1.5O4, there is 4 V voltage plateau in the charge–discharge profiles. This voltage plateau can be reduced by an annealing process, however it is hard to avoid it completely. In this study, a new strategy of partial substitution for Mn by Mg is applied. There is no 4 V voltage plateau in the charge–discharge profiles of Mg-doped compound LiNi0.5Mn1.45Mg0.05O4. This compound exhibits good electrochemical properties which can be used as cathode material of lithium ion batteries. At 1 C rate, it can deliver a capacity of around 129 mAh g−1 and remain good cycle performance
Availability note (English)
Available from http://dx.doi.org/10.1016/j.materresbull.2013.07.002Additional details
Identifiers
- DOI
- 10.1016/j.materresbull.2013.07.002;
- PII
- S0025-5408(13)00590-4;
Publishing Information
- Journal Title
- Materials Research Bulletin
- Journal Volume
- 48
- Journal Issue
- 11
- Journal Page Range
- p. 4960-4962
- ISSN
- 0025-5408
- CODEN
- MRBUAC
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45106660
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANNEALING; DOPED MATERIALS; ELECTRIC BATTERIES; ELECTROCHEMISTRY; INORGANIC COMPOUNDS; LITHIUM IONS; SYNTHESIS; X-RAY DIFFRACTION
- Descriptors DEC
- CHARGED PARTICLES; CHEMISTRY; COHERENT SCATTERING; DIFFRACTION; ELECTROCHEMICAL CELLS; ENERGY STORAGE SYSTEMS; ENERGY SYSTEMS; HEAT TREATMENTS; IONS; MATERIALS; SCATTERING
Optional Information
- Copyright
- Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.