Published November 1985 | Version v1
Journal article Metadata-only

X-ray topographic investigation of structural perfection of CdTe monocrystals

Creators

  • 1. Chernovitskij Gosudarstvennyj Univ. (Ukrainian SSR)
  • 2. AN Ukrainskoj SSR, Kiev. Inst. Poluprovodnikov

Description

Application possibilities of X-ray diffraction topography in the Lane geometry are clarified for the study of structural perfection of comparatively thick real crystals of CdTe. It is shown, that the most destinet topograms of CdTe monocrystals are obtained, when the survey is realized using the Lang method. The survey of topograms by the Borrmann method for CdTe monocrystals with the density of dislocations higher than 7x103 cm-2 is not perspective

Additional details

Additional titles

Original title (Russian)
Рентгенотопографическое исследование структурного совершенства монокристаллов CdTe

Publishing Information

Journal Title
Izv. Akad. Nauk SSSR, Neorg. Mater.
Journal Volume
21
Journal Issue
11
Series
Izv. Akad. Nauk SSSR, Neorg. Mater.
Journal Page Range
1879-1881
ISSN
0002-337X
CODEN
IVNMA

INIS

Country of Publication
Russian Federation
Country of Input or Organization
USSR
INIS RN
17054205
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
CADMIUM TELLURIDES; DISLOCATIONS; MICROSTRUCTURE; MONOCRYSTALS; SLIP; TWINNING
Descriptors DEC
CADMIUM COMPOUNDS; CHALCOGENIDES; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; CRYSTALS; LINE DEFECTS; TELLURIDES; TELLURIUM COMPOUNDS

Optional Information

Notes
For English translation see the journal Inorganic Materials (USA).