Published January 4, 2010 | Version v1
Journal article Metadata-only

Optical And Mass Spectrometric Investigation Of The Interaction Of Hydrogen With Nitrogen In (In)GaAsN Layers

Creators

  • 1. Department of Engineering Physics, University of Applied Sciences, Lothstrasse 34, 80335 Munich (Germany)
  • 2. Fraunhofer Institute IAF, Tullastrasse 72, 79108 Freiburg (Germany)
  • 3. Paul Drude Institute, Hausvogteiplatz 5-7, 10117 Berlin (Germany)

Description

Fourier transform infrared absorption spectroscopy and secondary ion mass spectroscopy have been carried out on GaAs based dilute nitride layers after treatment with H+ or D+ ions. Formation of N-H (D-H) centers is detected by vibrational absorption bands of H (D). The modes are assigned to two different complexes, each involving one H (D) atom. A major fraction of the hydrogen in the layers might be not or only loosely bound to nitrogen.

Additional details

Identifiers

DOI
10.1063/1.3295567;

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
1199
Journal Issue
1
Journal Page Range
p. 87-88
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
29. international conference on the physics of semiconductors
Dates
27 Jul - 1 Aug 2008
Place
Rio de Janeiro (Brazil)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41101884
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ABSORPTION SPECTROSCOPY; COLOR CENTERS; DEUTERIUM IONS; ELECTRONIC STRUCTURE; FOURIER TRANSFORMATION; GALLIUM ARSENIDES; HYDROGEN; HYDROGEN IONS 1 PLUS; ION MICROPROBE ANALYSIS; LAYERS; MASS SPECTROSCOPY; MOLECULAR BEAM EPITAXY; NITROGEN; SEMICONDUCTOR MATERIALS
Descriptors DEC
ARSENIC COMPOUNDS; ARSENIDES; CATIONS; CHARGED PARTICLES; CHEMICAL ANALYSIS; CRYSTAL DEFECTS; CRYSTAL GROWTH METHODS; CRYSTAL STRUCTURE; ELEMENTS; EPITAXY; GALLIUM COMPOUNDS; HYDROGEN IONS; INTEGRAL TRANSFORMATIONS; IONS; MATERIALS; MICROANALYSIS; NONDESTRUCTIVE ANALYSIS; NONMETALS; PNICTIDES; POINT DEFECTS; SPECTROSCOPY; TRANSFORMATIONS; VACANCIES

Optional Information

Notes
(c) 2009 American Institute of Physics