Normal emission photoelectron diffraction: a new technique for determining surface structure
Description
One technique, photoelectron diffraction (PhD) is characterized. It has some promise in surmounting some of the problems of LEED. In PhD, the differential (angle-resolved) photoemission cross-section of a core level localized on an adsorbate atom is measured as a function of some final state parameter. The photoemission final state consists of two components, one of which propagates directly to the detector and another which scatters off the surface and then propagates to the detector. These are added coherently, and interference between the two manifests itself as cross-section oscillations which are sensitive to the local structure around the absorbing atom. We have shown that PhD deals effectively with two- and probably also three-dimensionally disordered systems. Its non-damaging and localized, atom-specific nature gives PhD a good deal of promise in dealing with molecular overlayer systems. It is concluded that while PhD will never replace LEED, it may provide useful, complementary and possibly also more accurate surface structural information
Availability note (English)
MF available from INIS under the Report Number; Available from NTIS., PC A09/MF A01.
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Additional details
Publishing Information
- Imprint Pagination
- 177 p.
- Report number
- LBL--11017
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 11571690
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S36: MATERIALS SCIENCE;
- Descriptors DEI
- BINDING ENERGY; ELECTRON EMISSION; MEASURING INSTRUMENTS; NICKEL ALLOYS; PHOTOELECTRON SPECTROSCOPY; SELENIUM ALLOYS; SURFACE PROPERTIES
- Descriptors DEC
- ALLOYS; ELECTRON SPECTROSCOPY; EMISSION; ENERGY; SPECTROSCOPY; TRANSITION ELEMENT ALLOYS