Gamma spectra analysis from a NaI(Tl) scintillation detector using a micro-computer
Description
A software package of programs was devloped for qualitative and quantitative evaluation of gamma ray spectra obtained from a NaI(Tl) scintilation counter, by means of a micro-computer. The programs can easily be transformed for use with a Ge(Li) detector. The various algorithms enable automatic analyzing of a spectrum and also interactive or manual mode. The graphic programs display the measured spectrum as well as spectra of standard radionuclides which helps in the determination of peaks and related radionuclides in the spectrum. The peak search is carried out on a smoothed spectrum and is done by checking the behaviour of the second and third derivatives. The algorithm solves the problem of overlapping peaks and performs gaussian fitting, if necessary. Determination of the various radionuclides in the spectrum is done by linear minimum least squares techniques. Overall analysis of the radionuclides activities in the spectrum is obtained for samples of various counting geometries. In addition, a model was developed for efficiency calibration of flat 3X3 inch NaI(Tl) detectors for different samples measured in various counting geometries. It is based on point source experimental efficiency curve fitting. (author)
Availability note (English)
MF available from INIS under the Report Number.Files
22091988.pdf
Files
(8.7 MB)
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Additional details
Publishing Information
- Imprint Pagination
- 331 p.
- Report number
- NRCN--592
INIS
- Country of Publication
- Israel
- Country of Input or Organization
- Israel
- INIS RN
- 22091988
- Subject category
- S99: GENERAL AND MISCELLANEOUS;
- Resource subtype / Literary indicator
- Thesis, Computer Program Description
- Descriptors DEI
- ALGORITHMS; CALIBRATION; COMPARATIVE EVALUATIONS; COMPUTER CALCULATIONS; COMPUTER CODES; COMPUTER GRAPHICS; COMPUTER PROGRAM DOCUMENTATION; GAMMA SPECTRA; LEAST SQUARE FIT; MICROCOMPUTERS; NAI DETECTORS; PROGRAMMING; QUALITY ASSURANCE; SPECTRA UNFOLDING
- Descriptors DEC
- COMPUTERS; DATA PROCESSING; DIGITAL COMPUTERS; EVALUATION; MAXIMUM-LIKELIHOOD FIT; MEASURING INSTRUMENTS; NUMERICAL SOLUTION; RADIATION DETECTORS; SCINTILLATION COUNTERS; SOLID SCINTILLATION DETECTORS; SPECTRA