Optical properties and oxidation of α -phase Ag–Al thin films
- 1. Institute for Nanoscale Technology, University of Technology Sydney, PO Box 123, Broadway, NSW 2007 (Australia)
- 2. School of Mathematical and Physical Sciences, University of Newcastle, Callaghan, NSW 2308 (Australia)
Description
We investigate a series of Ag–Al thin films containing up to 12 at% Al with the purpose of discovering whether these alloys would be a better choice for nanophotonic applications than pure Ag. Variable angle spectroscopic ellipsometry, AFM, x-ray diffraction and density functional theory are applied to explore and characterize the materials. Electromagnetic simulations of optical properties are used to place the results into a theoretical framework. We find that the increase in electron-to-atom ratio associated with the Al additions changes the optical properties: additions of the order of 1–2 at% Al are beneficial as they are associated with favorable changes in the dielectric function, but for greater additions of Al there is a flattening of the absorption edge and an increase in optical loss. In addition, contents of more than about 2 at% Al are associated with the onset of time-dependent intergranular oxidation, which causes a pronounced dip in the reflectance spectrum at about 2.3–2.4 eV (∼500–540 nm). (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1361-6528/aa5782Additional details
Identifiers
Publishing Information
- Journal Title
- Nanotechnology (Print)
- Journal Volume
- 28
- Journal Issue
- 9
- Journal Page Range
- [10 p.]
- ISSN
- 0957-4484
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 50045471
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- ABSORPTION; ALUMINIUM COMPOUNDS; ATOMIC FORCE MICROSCOPY; BINARY ALLOY SYSTEMS; COMPUTERIZED SIMULATION; DENSITY FUNCTIONAL METHOD; DIELECTRIC MATERIALS; OPTICAL PROPERTIES; OXIDATION; SILVER COMPOUNDS; THIN FILMS; TIME DEPENDENCE; X-RAY DIFFRACTION
- Descriptors DEC
- ALLOY SYSTEMS; CALCULATION METHODS; CHEMICAL REACTIONS; COHERENT SCATTERING; DIFFRACTION; FILMS; MATERIALS; MICROSCOPY; PHYSICAL PROPERTIES; SCATTERING; SIMULATION; SORPTION; TRANSITION ELEMENT COMPOUNDS; VARIATIONAL METHODS