Published May 1981 | Version v1
Journal article

Field ion emission from thin tungsten wires covered with a layer from an etching procedure

  • 1. Fritz-Haber-Institut der Max-Planck-Gesellschaft, Berlin (Germany, F.R.)

Description

The preparation of etched, thin tungsten wires which have a relatively smooth surface is described. Diameters as small as 1 μm have been reached. From the electrochemical etching procedure a thin layer of Ksub(x)(Wsub(y)Osub(z)) remains on the surface. Such wires have been used as field ion emitters and their ability to field-ionize gases of high ionization potential is demonstrated by their use in field ion microscopy and field ion mass spectrometry. (orig.)

Additional details

Publishing Information

Journal Title
Int. J. Mass Spectrom. Ion Phys.
Journal Volume
38
Journal Issue
2/3
Series
Int. J. Mass Spectrom. Ion Phys.
Journal Page Range
241-254
ISSN
0020-7381

INIS

Country of Publication
Netherlands
Country of Input or Organization
Netherlands
INIS RN
12638708
Subject category
S07: ISOTOPES AND RADIATION SOURCES; S74: ATOMIC AND MOLECULAR PHYSICS;
Descriptors DEI
FIELD EMISSION; ION EMISSION; ION MICROSCOPY; ION SOURCES; LAYERS; MASS SPECTROSCOPY; TUNGSTEN; WIRES
Descriptors DEC
ELEMENTS; EMISSION; METALS; MICROSCOPY; SPECTROSCOPY; TRANSITION ELEMENTS