Published May 1981
| Version v1
Journal article
Field ion emission from thin tungsten wires covered with a layer from an etching procedure
Creators
- 1. Fritz-Haber-Institut der Max-Planck-Gesellschaft, Berlin (Germany, F.R.)
Description
The preparation of etched, thin tungsten wires which have a relatively smooth surface is described. Diameters as small as 1 μm have been reached. From the electrochemical etching procedure a thin layer of Ksub(x)(Wsub(y)Osub(z)) remains on the surface. Such wires have been used as field ion emitters and their ability to field-ionize gases of high ionization potential is demonstrated by their use in field ion microscopy and field ion mass spectrometry. (orig.)
Additional details
Publishing Information
- Journal Title
- Int. J. Mass Spectrom. Ion Phys.
- Journal Volume
- 38
- Journal Issue
- 2/3
- Series
- Int. J. Mass Spectrom. Ion Phys.
- Journal Page Range
- 241-254
- ISSN
- 0020-7381
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 12638708
- Subject category
- S07: ISOTOPES AND RADIATION SOURCES; S74: ATOMIC AND MOLECULAR PHYSICS;
- Descriptors DEI
- FIELD EMISSION; ION EMISSION; ION MICROSCOPY; ION SOURCES; LAYERS; MASS SPECTROSCOPY; TUNGSTEN; WIRES
- Descriptors DEC
- ELEMENTS; EMISSION; METALS; MICROSCOPY; SPECTROSCOPY; TRANSITION ELEMENTS