Published 1990 | Version v1
Miscellaneous

In-situ analysis of RHEED III-V semiconductors grown by MBE

  • 1. Sao Paulo Univ., Sao Carlos, SP (Brazil). Inst. de Fisica e Quimica

Description

Published in summary form only

Availability note (English)

Available from the Library of Comissao Nacional de Energia Nuclear, RJ, Brazil.

Additional details

Additional titles

Original title (Portuguese)
Analise in-situ de RHEED de semicondutores III-V crescidos por MBE

Publishing Information

Imprint Title
Proceedings of the 13. National Meeting on Condensed Matter Physics
Imprint Pagination
284 p.
Journal Page Range
p. 227.

Conference

Title
13. National Meeting on Condensed Matter Physics.
Dates
8-12 May 1990.
Place
Caxambu, MG (Brazil).

INIS

Country of Publication
Brazil
Country of Input or Organization
Brazil
INIS RN
22039573
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference, No Abstract, Non-conventional Literature
Descriptors DEI
CRYSTAL GROWTH; ELECTRON DIFFRACTION; EPITAXY; GALLIUM ARSENIDES; ROUGHNESS
Descriptors DEC
ARSENIC COMPOUNDS; ARSENIDES; COHERENT SCATTERING; DIFFRACTION; GALLIUM COMPOUNDS; PNICTIDES; SCATTERING; SURFACE PROPERTIES

Optional Information

Notes
Imprint:Anais do 13. Encontro Nacional de Fisica da Materia Condensada.